Selected Publications

JSS
[pdf] Kui Liu, Li Li, Anil Koyuncu, Dongsun Kim, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé, A Critical Review on the Evaluation of Automated Program Repair Systems, Journal of Systems and Software, Elsevier, Accepted for publication on Sep. 8, 2020

ASE
[pdf] Haoye Tian, Kui Liu, Abdoul Kader Kaboré, Anil Koyuncu, Li Li, Jacques Klein, Tegawendé F. Bissyandé, Evaluating Representation Learning of Code Changes fo Predicting Patch Correctness in Program Repair, 35th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE/ACM, Sep. 2020, To appear, Melbourne, Australia (Virtual Event), acceptance rate: 22.5% (93/414)

KDD
[pdf] Salah Ghamizi, Renaud Rwemalika, Maxime Cordy, Lisa Veiber, Tegawendé F. Bissyandé, Mike Papadakis, Jacques Klein and Yves Le Traon, Data-driven Simulation and Optimization for Covid-19 ExitStrategies, KDD 2020 (Health Day, special track on AI For Covid-19), ACM, Aug. 2020, To appear, San Diego, CA, USA (Virtual Event), acceptance rate: best KDD paper for AI for COVID-19

FSE
[pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Borrowing Your Enemy’s Arrows: the Case of Code Reuse in Android via Direct Inter-app Code Invocation, 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2020), Nov. 2020, To appear, Sacramento, CA, United States (Virtual Event), acceptance rate: 28% (101/360)

OpML
[pdf] Lisa Veiber, Kevin Allix, Yusuf Arslan, Tegawendé F. Bissyandé, Jacques Klein, Challenges Towards Production-Ready Explainable Machine Learning, 2020 USENIX Conference on Operational Machine Learning, Usenix, July 2020, To appear, Santa Clara, CA, USA (Virtual Event)

EMSE
[pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus, Yves Le Traon, FixMiner: Mining Relevant Fix Patterns for Automated Program Repair, Empirical Software Engineering (journal first), Springer, Vol. 25, Mar. 2020, pages 1980-2024

WWW
[pdf] Tianming Liu, Haoyu Wang, Li Li, Xiapu Luo, Feng Dong, Yao Guo, Liu Wang, Tegawendé F. Bissyandé and Jacques Klein, MadDroid: Characterising and Detecting Devious Ad Content for Android Apps, The Web Conference 2020 (the WebConf, formerly WWW), ACM, April 2020, pages 1715-1726, Taipei, Taiwan (Virtual Event), acceptance rate: 19.22% (217/1129)

ICSE
[pdf] Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, and Yves Le Traon, On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs, 42th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2020, To appear, Seoul, South Korea (Virtual Event), acceptance rate: 20.9% (129/617)

EMSE
[pdf] Li Li, Jun Gao, Tegawendé F. Bissyandé, Lei Ma, Xin Xia and Jacques Klein, CDA: Characterising Deprecated Android APIs, Empirical Software Engineering, Springer, Vol. 25, Jan. 2020 (Accepted for publication on Aug. 05, 2019), pages 2058-2098

Trans. on Reliability
[pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Understanding the Evolution of Android App Vulnerabilities, IEEE Transactions on Reliability (journal first), IEEE, (accepted for publication on November 15, 2019), Early Access on Dec. 2019

ICSME
[pdf] Mohamed A. Oumaziz, Jean-Rémy Falleri, Xavier Blanc, Tegawendé F. Bissyandé and Jacques Klein, Handling duplicates in Dockerfiles families: Learning from experts, 35th IEEE International Conference on Software Maintenance and Evolution (ICSME), IEEE, Oct. 2019, pages 524-535, Cleveland, Ohio, USA, acceptance rate: 22,96% (31/135)

FSE
[pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon, iFixR: Bug Report driven Program Repair, 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2019), ACM, Aug. 2019, pages 314-325, Tallinn, Estonia, acceptance rate: 24.4% (74/303)

ISSTA
[pdf] Pingfan Kong, Li Li, Jun Gao, Tegawendé F. Bissyandé, Jacques Klein, Mining Android Crash Fixes in the Absence of Issue- and Change-Tracking Systems, The International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2019, pages 78-89, Beijing, China, acceptance rate: 22.5% (32/142)

MSR
[pdf] Jun Gao, Pingfan Kong, Li Li, Tegawendé F. Bissyandé and Jacques Klein, Negative Results on Mining Crypto-API Usage Rules in Android Apps, 16th IEEE/ACM International Conference on Mining Software Repositories (MSR), IEEE, May 2019, pages 388-398, Montreal, Canada, acceptance rate: 25.4%, (32/126)

TSE
[pdf] Li Li, Tegawendé F. Bissyandé, and Jacques Klein, Rebooting Research on Detecting Repackaged Android Apps: Literature Review and Benchmark, IEEE Transactions on Software Engineering (journal first), IEEE, Accepted for publication on Feb. 19, 2019

TIFS
[pdf] Alexandre Bartel, Jacques Klein and Yves Le Traon, MUSTI : Prevention of Invalid Object Initialization Attacks at Runtime, IEEE Transactions on Information Forensics and Security (journal first), IEEE, vol. 14, no. 8, Aug. 2019 (Accepted for publication on January 16, 2019), Pages 2167-2178

ICST
[pdf] Kui Liu, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein and Yves Le Traon, You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems, 12th IEEE International Conference on Software Testing, Verification and Validation (ICST 2019), IEEE, Apr. 2019, pages 102-113, Xi'an, China, acceptance rate: 28.18% (31/110)

Trans. on Reliability
[pdf] Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein, Automated Testing of Android Apps: A Systematic Literature Review, IEEE Transactions on Reliability (journal first), Volume 68, Issue 1, IEEE, Mar. 2019 (accepted for publication on August 9, 2018), pages 45-66

FSE
[pdf] Feng Dong, Haoyu Wang, Li Li, Yao Guo, Tegawendé F. Bissyandé, Tianming Liu, Guoai Xu and Jacques Klein, FraudDroid: Automated Ad Fraud Detection for Android Apps, ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2018), ACM, Nov. 2018, pages 257-268, Lake Buena Vista, Florida, United States, acceptance rate: 21.1% (61/289)

ICSE
[pdf] Kisub Kim, Dongsun Kim, Tegawendé F. Bissyandé, Eunjong Choi, Li Li, Jacques Klein and Yves Le Traon, FaCoY – A Code-to-Code Search Engine, 40th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2018, pages 946-957, Gothenburg, Sweden, acceptance rate: 20.9% (105/502)

EMSE
[pdf] Raphael Sirres, Tegawendé F. Bissyandé, Dongsun Kim, David Lo, Jacques Klein, Kisub Kim, Yves Le Traon, Augmenting and Structuring User Queries to Support Efficient Free-Form Code Search, Empirical Software Engineering (journal first), Springer, Jan. 2018, Volume 90, pages 27-39

MSR
[pdf] Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, AndroZoo: Collecting Millions of Android Apps for the Research Community, 13th International Conference on Mining Software Repositories (MSR), Data Showcase track, ACM, May 2016, pages 468-471, Austin, Texa, USA

ICSE
[pdf] Li Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Steven Arzt, Siegfried Rasthofer, Eric Bodden, Damien Octeau and Patrick McDaniel, IccTA: Detecting Inter-Component Privacy Leaks in Android Apps, The 37th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2015, pages 280-291, Firenze, Italy, acceptance rate: 18.5%, 84/452

EMSE
[pdf] Kevin Allix, Tegawendé F. Bissyandé, Quentin Jérome, Jacques Klein, Radu State, and Yves Le Traon, Empirical Assessment of Machine Learning-Based Malware Detectors for Android: Measuring the Gap between In-the-Lab and In-the-Wild Validation Scenarios, Empirical Software Engineering (journal first), Springer, Feb. 2016, Volume 21, Issue 1 (First online: November 2014), pages 183–211

TSE
[pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon, Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 7, Jul. 2014, pages 650 - 670

TSE
[pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Static Analysis for Extracting Permission Checks of a Large Scale Framework: The Challenges And Solutions for Analyzing Android, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 6, Jun. 2014, pages 617-632

PLDI
[pdf] Steven Arzt, Siegfried Rasthofer, Christian Fritz, Eric Bodden, Alexandre Bartel, Jacques Klein, Yves Le Traon, Damien Octeau, and Patrick McDaniel, FlowDroid: Precise Context, Flow, Field, Object-sensitive and Lifecycle-aware Taint Analysis for Android Apps, ACM SIGPLAN conference on Programming Language Design and Implementation (PLDI), Jun. 2014, pages 259-269, Edinburgh, UK, acceptance rate: 18%, 52/287

Usenix Security
[pdf] Damien Octeau, Patrick McDaniel, Somesh Jha, Alexandre Bartel, Eric Bodden, Jacques Klein, Yves Le Traon, Effective Inter-Component Communication Mapping in Android with Epicc: An Essential Step Towards Holistic Security Analysis, Usenix Security, USENIX Association, Aug. 2013, pages 543-558, Washington D.C., USA, acceptance rate: 16%, 44/277