TSE
[pdf] Tiezhu Sun, Kevin Allix, Kisub Kim, Xin Zhou, Dongsun Kim, David Lo, Tegawendé F. Bissyandé, Jacques Klein, DexBERT: Effective, Task-Agnostic and Fine-grained Representation Learning of Android Bytecode, IEEE Transactions on Software Engineering, journal first, IEEE, Accepted for publication on Aug. 24, 2023
ASE Journal [pdf][Open Access] Qianguo Chen, Teng Zhou, Kui Liu, Li Li, Chunpeng Ge, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé, Tips: towards automating patch suggestion for vulnerable smart contracts, Automated Software Engineering Journal, journal first, Springer, Sep. 2023 (Accepted for publication on Jun. 25, 2023)
TOSEM [pdf] Xueqi Dang, Yinghua Li, Mike Papadakis, Jacques Klein, Tegawendé F. Bissyandé, Yves Le Traon, Mutation-based Test Input Prioritization for Graph Neural Networks, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, ACM, Accepted for publication on Jun. 13, 2023
ISSTA [pdf] Nadia Daoudi, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, Guided Retraining to Enhance the Detection of Difficult Android Malware, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2023, To appear, Seattle, WA, USA
ISSTA [pdf] Abdoul Kader Kaboré, Earl T. Barr, Jacques Klein, Tegawendé F. Bissyandé, CodeGrid: A Grid Representation of Code, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2023, To appear, Seattle, WA, USA
KONVENS
[pdf] Cedric Lothritz, Saad Ezzini, Christoph Purschke, Tegawendé F. Bissyandé, Jacques Klein, Isabella Olariu, Andrey Boytsov, Clément Lefebvre and Anne Goujon, Comparing Pre-Training Schemes for Luxembourgish BERT Models, Proceedings of the 19th Conference on Natural Language Processing (KONVENS 2023), ACL Anthology, To appear, Ingolstadt, Germany
KONVENS
[pdf] Isabella Olariu, Cedric Lothritz, Tegawendé F. Bissyandé, Jacques Klein, Evaluating Data Augmentation Techniques for the Training of Luxembourgish Language Models, Proceedings of the 19th Conference on Natural Language Processing (KONVENS 2023), ACL Anthology, To appear, Ingolstadt, Germany
CSUR [pdf][Open Access] Kisub Kim, Sankalp Ghatpande, Dongsun Kim, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Big Code Search: a Bibliography, ACM Computing Surveys, ACM, Volume 56, Issue 1, Aug. 2023 (Accepted for publication on Apr. 13, 2023), pages 1-49
NoDaLiDa [pdf] Cedric Lothritz, Bertrand Lebichot, Kevin Allix, Saad Ezzini, Tegawendé F. Bissyandé, Jacques Klein, Andrey Boytsov, Clément Lefebvre and Anne Goujon, Evaluating the Impact of Text De-Identification on Downstream NLP Tasks, The 24th Nordic Conference on Computational Linguistics (NoDaLiDa), May 2023, To appear, Tórshavn, Faroe Islands
AAAI [pdf] Weiguo Pian, Hanyu Peng, Xunzhu Tang, Tiezhu Sun, Haoye Tian, Andrew Habib, Jacques Klein, Tegawendé F. Bissyandé, MetaTPTrans: A Meta Learning Approach for Multilingual Code Representation Learning, Thirty-Seventh AAAI Conference on Artificial Intelligence, Feb. 2023, To appear, Washington D.C., USA
MobileSoft NIER [pdf] Maria Kober, Jordan Samhi, Steven Arzt, Tegawendé F. Bissyandé and Jacques Klein, Sensitive and Personal Data: What Exactly Are You Talking About?, 10th International Conference on Mobile Software Engineering and Systems (MobileSoft 2023), IEEE, May 2023, To appear, Melbourne, Australia
ICNLP [pdf] Yewei Song, Saad Ezzini, Jacques Klein, Tegawendé F. Bissyandé, Clément Lefebvre, Anne Goujon, Letz Translate: Low-Resource Machine Translation for Luxembourgish, 5th International Conference on Natural Language Processing, Mar. 2023, To appear, Guangzhou, China
TOSEM [pdf] Kui Liu, Jingtang Zhang, Li Li, Anil Koyuncu, Dongsun Kim, Chunpeng Ge, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé, Reliable Fix Patterns Inferred from Static Checkers for Automated Program Repair, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, ACM, Jan. 2023 (Accepted for publication on Nov. 19, 2022), pages 1-38
2022
TOSEM [pdf] Haoye Tian, Kui Liu, Yinghua Li, Abdoul Kader Kaboré, Anil Koyuncu, Andrew Habib, Li Li, Junhao Wen, Jacques Klein, Tegawendé F. Bissyandé, The Best of Both Worlds: Combining Learned Embeddings with Engineered Features for Accurate Prediction of Correct Patches, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, ACM, Dec. 2022 (Accepted for publication on Nov. 1, 2022), pages 1-33
TOSEM [pdf] Xiaoyu Sun, Xiao Chen, Li Li, Haipeng Cai, John Grundy, Jordan Samhi, Tegawendé F. Bissyandé and Jacques Klein, Demystifying Hidden Sensitive Operations in Android apps, ACM Transactions on Software Engineering and Methodology (TOSEM), Volume 32, Issue 2, journal first, ACM, Dec. 2022 (Accepted for publication on Oct. 13, 2022), pages 1-30
EMSE [pdf] Nadia Daoudi, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, Assessing the opportunity of combining state-of-the-art Android malware detectors, Empirical Software Engineering, journal first, Springer, Dec. 2022 (Accepted for publication on Oct. 10, 2022), pages 1-42
SPE [pdf] Atefeh Nirumand, Bahman Zamani, Behrouz Tork Ladani, Jacques Klein and Tegawendé F. Bissyandé, A Model-Based Framework for Inter-App Vulnerability Analysis of Android Applications, Software: Practice and Experience, journal first, Wiley, Nov. 2022 (Accepted for publication on Oct. 26, 2022), pages 1-42
ICMLA [pdf] Yusuf Arslan, Kevin Allix, Clément Lefebvre, Andrey Boytsov, Tegawendé F. Bissyandé and Jacques Klein, Prototypical Explanations Articulated Undersampling for Imbalanced Datasets, 21st IEEE International Conference on Machine Learning and Applications (ICMLA), IEEE, Dec. 2022, pages 1449-1454 , Nassau, Bahamas
IST [pdf] Dapeng Yan, Kui Liu, Yuqing Niu, Li Li, Zhe Liu, Zhiming Liu, Jacques Klein, Tegawendé F. Bissyandé, Crex: Predicting Patch Correctness in Automated Repair of C Programs through Transfer Learning of Execution Semantics, Information and Software Technology, journal first, Elsevier, Dec. 2022 (Accepted for publication on August 8, 2022), pages 1-12
SCAM [pdf] Boladji Vinny Adjibi, Fatou N'Diaye Mbodji, Kevin Allix, Jacques Klein and Tegawendé F. Bissyandé, The Devil is in the Details: Unwrapping the Cryptojacking Malware Ecosystem on Android, 22nd IEEE International Working Conference on Source Code Analysis and Manipulation, IEEE, Oct. 2022, pages 153-163, Limassol, Cyprus
ASE [pdf] Haoye Tian, Xunzhu Tang, Andrew Habib, Shangwen Wang, Kui Liu, Xin Xia, Jacques Klein, Tegawendé F. Bissyandé, Is this Change the Answer to that Problem?: Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness, 37th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE/ACM, Oct. 2022, pages 1-13, Ann Arbor, Michigan, United States
TOSEM [pdf] Ahmed Khanfir, Anil Koyuncu, Mike Papadakis, Maxime Cordy, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, iBiR: Bug Report driven Fault Injection, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, ACM, Jun. 2022 (Accepted for publication on May 13, 2022), pages 1-32
LREC [pdf] Cedric Lothritz, Bertrand Lebichot, Kevin Allix, Lisa Veiber, Tegawendé F. Bissyandé, Jacques Klein, Andrey Boytsov, Clément Lefebvre and Anne Goujon, LuxemBERT: Simple and Practical Data Augmentation in Language Model Pre-Training for Luxembourgish, 13th Language Resources and Evaluation Conference (LREC), ELRA, Jun. 2022, pages 5080–5089, Marseille, France
EMSE [pdf] Delwende Arthur Sawadogo, Tegawendé F. Bissyandé, Naouel Moha, Kevin Allix, Jacques Klein, Li Li and Yves Le Traon, SSPCatcher: Learning to Catch Security Patches, Empirical Software Engineering, journal first, Springer, Aug. 2022 (Accepted for publication on Mar. 17, 2022), pages 1-32
CD-MAKE [pdf] Yusuf Arslan, Bertrand Lebichot, Kevin Allix, Lisa Veiber, Clément Lefebvre, Andrey Boytsov, Anne Goujon, Tegawendé F. Bissyandé and Jacques Klein, Towards Refined Classifications driven by SHAP explanations, International IFIP Cross Domain (CD) Conference for Machine Learning & Knowledge Extraction (MAKE) - CD-MAKE 2022, Springer, LNCS vol 13480, Aug. 2022, pages 1-14, Vienna, Austria
JSS [pdf] Kisub Kim, Sankalp Ghatpande, Kui Liu, Anil Koyuncu, Dongsun Kim, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, DigBug – Pre/Post-processing Operator Selection for Accurate Bug Localization, Journal of Systems and Software, journal first, Elsevier, Jul. 2022 (Accepted for publication on Mar. 7, 2022), Volume 189, pages 1-16
MSR [pdf] Jordan Samhi, Tegawendé F. Bissyandé, Jacques Klein, TriggerZoo: A Dataset of Android Applications Automatically Infected with Logic Bombs, IEEE/ACM International Conference on Mining Software Repositories, Data/Tool Showcase Track (MSR) , IEEE/ACM, May 2022, pages 459-463, Pittsburgh, PA, USA
TOSEM [pdf] Haoye Tian, Yinghua Li, Weiguo Pian, Abdoul Kader Kaboré, Kui Liu, Andrew Habib, Jacques Klein, Tegawendé F. Bissyandé, Predicting Patch Correctness Based on the Similarity of Failing Test Cases, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, ACM, Volume 31, Issue 4, Oct. 2022 (Accepted for publication on Jan. 10, 2022), pages 1-30
ICSE [pdf] Jordan Samhi, Jun Gao, Nadia Daoudi, Pierre Graux, Henri Hoyez, Xiaoyu Sun, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, JuCify: A Step Towards Android Code Unification for Enhanced Static Analysis, 44rd International Conference on Software Engineering (ICSE), IEEE/ACM, May 2022, pages 1232-1244, Pittsburgh, PA, USA, acceptance rate: 26% (197/751)
ICSE [pdf] Jordan Samhi, Li Li, Tegawendé F. Bissyandé, Jacques Klein, Difuzer: Uncovering Suspicious Hidden Sensitive Operations in Android Apps, 44rd International Conference on Software Engineering (ICSE), IEEE/ACM, May 2022, pages 723-735, Pittsburgh, PA, USA, acceptance rate: 26% (197/751)
TOPS [pdf] Nadia Daoudi, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, A Deep Dive inside DREBIN: An Explorative Analysis beyond Android Malware Detection Scores, ACM Transactions on Privacy and Security (TOPS), journal first, ACM, Volume 25, Issue 2, May 2022 (Accepted for publication on Nov. 30, 2021), pages 1-28
ICAART [pdf] Yusuf Arslan, Kevin Allix, Bertrand Lebichot, Lisa Veiber, Andrey Boytsov, Clément Lefebvre, Anne Goujon, Tegawendé F. Bissyandé, Jacques Klein, On the Suitability of SHAP Explanations for Refining Classifications, 14th International Conference on Agents and Artificial Intelligence (ICAART 2022), Feb. 2022, pages 395-402, Online Event
TOSEM [pdf] Patrick Keller, Abdoul Kader Kaboré, Laura Plein, Jacques Klein, Yves Le Traon, Tegawendé F. Bissyandé, What You See is What it Means! Semantic Representation Learning of Code based on Visualization, ACM Transactions on Software Engineering and Methodology (TOSEM), Volume 31, Issue 2, journal first, ACM, Volume 31, Issue 2, Apr. 2022 (Accepted for publication on Sep. 3, 2021), pages 1-34
2021
MLHat [pdf] Nadia Daoudi, Jordan Samhi, Abdoul Kader Kaboré, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, DexRay: A Simple, yet Effective Deep Learning Approach to Android Malware Detection based on Image Representation of Bytecode, The 2nd International Workshop on Deployable Machine Learning for Security Defense (MLHat @KDD), Springer, Aug. 2021, pages 81-106, Singapore, Singapore (Virtual Event)
ASE Journal [pdf] Pingfan Kong, Li Li, Jun Gao, Timothée Riom, Yanjie Zhao, Tegawendé F. Bissyandé, Jacques Klein, Anchor: Locating Android Framework-specific Crashing Faults, Automated Software Engineering Journal, journal first, Springer, Jul. 2021, pages 1-33
ICSME [pdf] Jingtang Zhang, Kui Liu, Dongsun Kim, Li Li, Zhe Liu, Jacques Klein and Tegawendé F. Bissyandé, Revisiting Test Cases to Boost Generate-and-Validate Program Repair, 37th International Conference on Software Maintenance and Evolution (ICSME), IEEE, Sep. 2021, pages 35-46, Luxembourg, Luxembourg (Virtual), acceptance rate: 24.0% (43/179)
ICSME [pdf] Teng Zhou, Kui Liu, Li Li, Zhe Liu, Jacques Klein and Tegawendé F. Bissyandé, SmartGift: Learning to Generate Practical Inputs for Testing Smart Contracts, 37th International Conference on Software Maintenance and Evolution (ICSME), IEEE, Sep. 2021, pages 23-34, Luxembourg, Luxembourg (Virtual), acceptance rate: 24.0% (43/179)
ASSS [pdf] Jacques Klein, A Journey Through Android App Analysis: Solutions and Open Challenges, Invited Keynote Paper, Proceedings of the 2021 International Symposium on Advanced Security on Software and Systems (ASSS 2021@ AsiaCCS), ACM, May 2021, pages 1-6
EMSE [pdf] Deheng Yang, Kui Liu, Dongsun Kim, Anil Koyuncu, Kisub Kim, Haoye Tian, Yan Lei, Xiaoguang Mao, Jacques Klein, Tegawendé F. Bissyandé, Where Were the Repair Ingredients for Defects4J Bugs? Exploring the Impact of Repair Ingredient Retrieval on the Performance of 24 Program Repair Systems, Empirical Software Engineering, journal first, Springer, Sep. 2021 (Accepted for publication on Jun. 08, 2021), pages 1-33
NLDB [pdf] Cedric Lothritz, Kevin Allix, Bertrand Lebichot, Lisa Veiber, Tegawendé F. Bissyandé and Jacques Klein, Comparing MultiLingual and Multiple MonoLingual Models for Intent Classification and Slot Filling, 26th International Conference on Applications of Natural Language to Information Systems, NLDB 2021, Springer, LNCS 12801, June 2021, pages 367-375, Saarbrücken, Germany (Virtual)
EMSE [pdf] Nadia Daoudi, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, Lessons Learnt on Reproducibility in Machine Learning Based Android Malware Detection, Empirical Software Engineering, journal first, Springer, May 2021 (Accepted for publication on Feb. 26, 2021), Open Access, pages 1-53
FinWeb [pdf] Yusuf Arslan, Kevin Allix, Lisa Veiber, Cedric Lothritz, Tegawendé F. Bissyandé, Jacques Klein and Anne Goujon, A Comparison of Pre-Trained Language Models for Multi-Class Text Classification in the Financial Domain, The 1st Workshop on Financial Technology on the Web (FinWeb), ACM, Apr. 2021, pages 260-268, @TheWebConf, Ljubljana, Slovenia (virtual event)
EMSE [pdf] Timothée Riom, Arthur D. Sawadogo, Kevin Allix, Alexandre Bartel, Tegawendé F. Bissyandé, Naouel Moha and Jacques Klein, Revisiting the VCCFinder Approach for the Identification of Vulnerability-Contributing Commits, Empirical Software Engineering, journal first, Springer, Mar 2021 (Accepted for publication on Jan. 22, 2021), pages 1-30
EMSE [pdf] Jordan Samhi, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein, A First Look at Android Applications in Google Play related to Covid-19, Empirical Software Engineering, journal first, Springer, Apr. 2021 (Accepted for publication on Jan. 15, 2021), pages 1-45
TOSEM [pdf] Yanjie Zhao, Li Li, Haoyu Wang, Haipeng Cai, Tegawendé F. Bissyandé, Jacques Klein, John Grundy, On the Impact of Sample Duplication in Machine Learning based Android Malware Detection, ACM Transactions on Software Engineering and Methodology (TOSEM), journal first, Volume 30, Issue 3, ACM, May 2021 (Accepted for publication on Jan. 07, 2021), pages 1-38
JSS [pdf] Kui Liu, Li Li, Anil Koyuncu, Dongsun Kim, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé, A Critical Review on the Evaluation of Automated Program Repair Systems, Journal of Systems and Software, Elsevier, Jan. 2021, Volume 171, (Accepted for publication on Sep. 8, 2020), pages 1-13
ICSE [pdf] Jordan Samhi, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, RAICC: Revealing Atypical Inter-Component Communication in Android Apps, 43rd International Conference on Software Engineering (ICSE), IEEE/ACM, May 2021, pages 1398-1409, Madrid, Spain (Virtual Conference), acceptance rate: 22.4% (138/615)
TOSEM [pdf] Xiaoyu Sun, Li Li, Tegawendé F. Bissyandé, Jacques Klein, Damien Octeau, John Grundy, Taming Reflection: An Essential Step Towards Whole-Program Analysis of Android Apps, ACM Transactions on Software Engineering and Methodology (TOSEM), Volume 30, Issue 3, ACM, Apr. 2021 (Accepted for publication on Nov. 29, 2020), pages 1-36
2020
COLING [pdf] Cedric Lothritz, Kevin Allix, Lisa Veiber, Tegawendé F. Bissyandé and Jacques Klein, Evaluating Pretrained Transformer-based Models on the Task of Fine-Grained Named Entity Recognition, 28th International Conference on Computational Linguistics (COLING), Dec. 2020, pages 3750-3760, Barcelona, Spain (virtual event), acceptance rate: 33.4% (644/1956)
ASE [pdf] Haoye Tian, Kui Liu, Abdoul Kader Kaboré, Anil Koyuncu, Li Li, Jacques Klein, Tegawendé F. Bissyandé, Evaluating Representation Learning of Code Changes fo Predicting Patch Correctness in Program Repair, 35th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE/ACM, Sep. 2020, pages 981-992, Melbourne, Australia (Virtual Event), acceptance rate: 22.5% (93/414)
KDD [pdf] Salah Ghamizi, Renaud Rwemalika, Maxime Cordy, Lisa Veiber, Tegawendé F. Bissyandé, Mike Papadakis, Jacques Klein and Yves Le Traon, Data-driven Simulation and Optimization for Covid-19 Exit Strategies, 26th ACM SIGKDD International Conference on Knowledge Discovery & Data Mining (KDD 2020, special track on AI For Covid-19), ACM, Aug. 2020, pages 3434-3442, San Diego, CA, USA (Virtual Event), acceptance rate: best KDD paper for AI for COVID-19
FSE [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Borrowing Your Enemy’s Arrows: the Case of Code Reuse in Android via Direct Inter-app Code Invocation, 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2020), ACM, Nov. 2020, pages 939-951, Sacramento, CA, United States (Virtual Event), acceptance rate: 28% (101/360)
OpML [pdf] Lisa Veiber, Kevin Allix, Yusuf Arslan, Tegawendé F. Bissyandé, Jacques Klein, Challenges Towards Production-Ready Explainable Machine Learning, 2020 USENIX Conference on Operational Machine Learning, Usenix, July 2020, pages 1-3, Santa Clara, CA, USA (Virtual Event)
EMSE [pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus, Yves Le Traon, FixMiner: Mining Relevant Fix Patterns for Automated Program Repair, Empirical Software Engineering (journal first), Springer, Vol. 25, Mar. 2020, pages 1980-2024
WWW [pdf] Tianming Liu, Haoyu Wang, Li Li, Xiapu Luo, Feng Dong, Yao Guo, Liu Wang, Tegawendé F. Bissyandé and Jacques Klein, MadDroid: Characterising and Detecting Devious Ad Content for Android Apps, The Web Conference 2020 (the WebConf, formerly WWW), ACM, April 2020, pages 1715-1726, Taipei, Taiwan (Virtual Event), acceptance rate: 19.22% (217/1129)
ICSE [pdf] Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, and Yves Le Traon, On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs, 42nd International Conference on Software Engineering (ICSE), IEEE/ACM, May 2020, pages 615-627, Seoul, South Korea (Virtual Event), acceptance rate: 20.9% (129/617)
EMSE [pdf] Li Li, Jun Gao, Tegawendé F. Bissyandé, Lei Ma, Xin Xia and Jacques Klein, CDA: Characterising Deprecated Android APIs, Empirical Software Engineering, Springer, Vol. 25, Jan. 2020 (Accepted for publication on Aug. 05, 2019), pages 2058-2098
2019
Trans. on Reliability [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Understanding the Evolution of Android App Vulnerabilities, IEEE Transactions on Reliability (journal first), IEEE, (accepted for publication on November 15, 2019), Early Access on Dec. 2019
ICSME [pdf] Mohamed A. Oumaziz, Jean-Rémy Falleri, Xavier Blanc, Tegawendé F. Bissyandé and Jacques Klein, Handling duplicates in Dockerfiles families: Learning from experts, 35th IEEE International Conference on Software Maintenance and Evolution (ICSME), IEEE, Oct. 2019, pages 524-535, Cleveland, Ohio, USA, acceptance rate: 22,96% (31/135)
FSE [pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon, iFixR: Bug Report driven Program Repair, 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2019), ACM, Aug. 2019, pages 314-325, Tallinn, Estonia, acceptance rate: 24.4% (74/303)
ICECCS [pdf] Jun Gao, Li Li, Tegawendé F. Bissyandé and Jacques Klein, On the Evolution of Mobile App Complexity, 24th International Conference on Engineering of Complex Computer Systems (ICECCS), Nov. 2019, pages 200-209, Hong Kong, acceptance rate: 23,86% (21/88)
ISSTA [pdf] Pingfan Kong, Li Li, Jun Gao, Tegawendé F. Bissyandé, Jacques Klein, Mining Android Crash Fixes in the Absence of Issue- and Change-Tracking Systems, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2019, pages 78-89, Beijing, China, acceptance rate: 22.5% (32/142)
JSS [pdf] Li Li, Timothée Riom, Tegawendé F. Bissyandé, Haoyu Wang, Jacques Klein, and Yves Le Traon, Revisiting the Impact of Common Libraries for Android-related Investigations, Journal of Systems and Software, Elsevier, Aug. 2019 (accepted for publication on Apr. 25, 2019), pages 157-175, Volume 154
MSR [pdf] Jun Gao, Pingfan Kong, Li Li, Tegawendé F. Bissyandé and Jacques Klein, Negative Results on Mining Crypto-API Usage Rules in Android Apps, 16th IEEE/ACM International Conference on Mining Software Repositories (MSR), IEEE, May 2019, pages 388-398, Montreal, Canada, acceptance rate: 25.4%, (32/126)
TSE [pdf] Li Li, Tegawendé F. Bissyandé, and Jacques Klein, Rebooting Research on Detecting Repackaged Android Apps: Literature Review and Benchmark, IEEE Transactions on Software Engineering (journal first), IEEE, Accepted for publication on Feb. 19, 2019
SANER [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Should You Consider Adware as Malware in Your Study?, ERA Track of the 26rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), IEEE, Feb. 2019, pages 604-608, Hangzhou, China, acceptance rate: 34.78%, (8/23)
TIFS [pdf] Alexandre Bartel, Jacques Klein and Yves Le Traon, MUSTI : Prevention of Invalid Object Initialization Attacks at Runtime, IEEE Transactions on Information Forensics and Security (journal first), IEEE, vol. 14, no. 8, Aug. 2019 (Accepted for publication on January 16, 2019), pages 2167-2178
JCST [pdf] Li Li, Tegawendé F. Bissyandé, Haoyu Wang and Jacques Klein, On Identifying and Explaining Similarities in Android Apps, Journal of Computer Science and Technology, Springer, Vol.34 No.2, Mar. 2019, pages 437–455
ICST [pdf] Kui Liu, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein and Yves Le Traon, You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems, 12th IEEE International Conference on Software Testing, Verification and Validation (ICST 2019), IEEE, Apr. 2019, pages 102-113, Xi'an, China, acceptance rate: 28.18% (31/110)
Trans. on Reliability [pdf] Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein, Automated Testing of Android Apps: A Systematic Literature Review, IEEE Transactions on Reliability (journal first), Volume 68, Issue 1, IEEE, Mar. 2019 (accepted for publication on August 9, 2018), pages 45-66
2018
ISSRE [pdf] Li Li, Tegawendé F. Bissyandé and Jacques Klein, MoonlightBox: Mining Android API Histories for Uncovering Release-time Inconsistencies, The 29th IEEE International Symposium on Software Reliability Engineering (ISSRE), IEEE, Oct. 2018, pages 212-223, Memphis, TN, USA, acceptance rate: 23.96% (23/96)
IST [pdf] Jabier Martinez, Tewfik Ziadi, Mike Papadakis, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Feature location benchmark for extractive software product line adoption research using realistic and synthetic Eclipse variants, Information and Software Technology (journal first), Elsevier, Dec. 2018, Volume 104, pages 46-59
FSE [pdf] Feng Dong, Haoyu Wang, Li Li, Yao Guo, Tegawendé F. Bissyandé, Tianming Liu, Guoai Xu and Jacques Klein, FraudDroid: Automated Ad Fraud Detection for Android Apps, ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2018), ACM, Nov. 2018, pages 257-268, Lake Buena Vista, Florida, United States, acceptance rate: 21.1% (61/289)
ISSTA [pdf] Li Li, Tegawendé F. Bissyandé, Haoyu Wang and Jacques Klein, CiD: Automating the Detection of API-related Compatibility Issues in Android Apps, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2018, pages 153-163, Amsterdam, Netherlands, acceptance rate: 23.5% (31/132)
MSR [pdf] Li Li, Jun Gao, Tegawendé F. Bissyandé, Lei Ma, Xin Xia, Jacques Klein, Characterising Deprecated Android APIs, 15th International Conference on Mining Software Repositories (MSR 2018), ACM, May 2018, pages 254-264, Gothenburg, Sweden
ICSR [pdf] Jabier Martinez, Jean-Sébastien Sottet, Alfonso García-Frey, Tegawendé F. Bissyandé, Tewfik Ziadi, Jacques Klein, Paul Temple, Mathieu Acher and Yves Le Traon, Towards Estimating and Predicting User Perception on Software Product Variants, The 17th International Conference on Software Reuse, Springer, LNCS, volume 10826, May 2018, pages 23-40, Madrid, Spain
ICSE [pdf] Kisub Kim, Dongsun Kim, Tegawendé F. Bissyandé, Eunjong Choi, Li Li, Jacques Klein and Yves Le Traon, FaCoY – A Code-to-Code Search Engine, 40th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2018, pages 946-957, Gothenburg, Sweden, acceptance rate: 20.9% (105/502)
EDBT [pdf] Daoyuan Li, Jessica Lin, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Extracting Statistical Graph Features for Accurate and Efficient Time Series Classification, 21st International Conference on Extending Database Technology (EDBT), Mar. 2018, page 205-216
EMSE [pdf] Raphael Sirres, Tegawendé F. Bissyandé, Dongsun Kim, David Lo, Jacques Klein, Kisub Kim, Yves Le Traon, Augmenting and Structuring User Queries to Support Efficient Free-Form Code Search, Empirical Software Engineering (journal first), Springer, Jan. 2018, Volume 90, pages 27-39
2017
JCST [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Haipeng Cai, David Lo, Yves Le Traon, On Locating Malicious Code in Piggybacked Android Apps, Journal of Computer Science and Technology, Springer, Nov. 2017, Volume 32, Issue 6, pages 1108–1124
TrustCom [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein, SimiDroid: Identifying and Explaining Similarities in Android Apps, 16th IEEE International Conference on Trust, Security and Privacy in Computing and Communications (IEEE TrustCom-17), IEEE, Aug. 2017, pages 136-143, Sydney, Australia
IST [pdf] Xinli Yang, David Lo, Li Li, Xin Xia, Tegawendé F. Bissyandé and Jacques Klein, Comprehending Malicious Android Apps By Mining Topic-Specific Data Flow Signatures, Information and Software Technology (journal first), Elsevier, Oct. 2017, Volume 88, pages 67-95
ISSTA [pdf] Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus and Yves Le Traon, Impact of Tool Support in Patch Construction, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2017, pages 237-248, Santa Barbara, USA, acceptance rate: 26% (31/118)
BookChapter [pdf] Jabier Martinez, Jean-Sébastien Sottet, Alfonso Garcıa Frey, Tewfik Ziadi, Tegawendé F. Bissyandé, Jean Van- derdonckt, Jacques Klein, and Yves Le Traon, Variability Management and Assessment for User Interface Design, Human Centered Software Product Lines. Human-Computer Interaction Series, Springer, 2017, pages 81–106
MobileSoft [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Haipeng Cai, David Lo, Yves Le Traon, Automatically Locating Malicious Packages in Piggybacked Android Apps, 4th IEEE/ACM International Conference on Mobile Software Engineering and Systems (MobileSoft), IEEE, May 2017, pages 170-174, Buenos Aires, Argentina
IST [pdf] Li Li, Tegawendé F. Bissyandé, Mike Papadakis, Siegfried Rasthofer, Alexandre Bartel, Damien Octeau, Jacques Klein, Yves Le Traon, Static Analysis of Android Apps: A Systematic Literature Review, Information and Software Technology (journal first), Elsevier, Aug. 2017, Volume 90, pages 67-95
MSR [pdf] Médéric Hurier, Tegawendé F. Bissyandé, Yves Le Traon, Jacques Klein, Guillermo Suarez-Tangil, Santanu Kumar Dash and Lorenzo Cavallaro, Euphony: Harmonious Unification of Cacophonous Anti-Virus Vendor Labels for Android Malware, The 14th International Conference on Mining Software Repositories (MSR), IEEE/ACM, May 2017, pages 425-435, Buenos Aires, Argentina, acceptance rate: 30.6% (37/121)
TIFS [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, David Lo, Lorenzo Cavallaro, Understanding Android App Piggybacking: A Systematic Study of Malicious Code Grafting, IEEE Transactions on Information Forensics and Security (journal first), Volume: 12, Issue: 6, IEEE, June 2017, online Jan. 2017, pages 1269-1284
SAC [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Sensing by Proxy in Buildings with Agglomerative Clustering of Indoor Temperature Movements, The 32st ACM/SIGAPP Symposium on Applied Computing (SAC), IoT Track, ACM, Apr. 2017, pages 477-484, Marrakesh, Morocco
2016
IJSEKE [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Time Series Classification with Discrete Wavelet Transformed Data, International Journal of Software Engineering and Knowledge Engineering, Volume 26, Issue 09n10, November & December 2016 (Accepted for publication in October 2016), pages 1361–1377
ASE [pdf] Li Li, Tegawendé F. Bissyandé, Damien Octeau and Jacques Klein, Reflection-Aware Static Analysis of Android Apps, 31st IEEE/ACM International Conference on Automated Software Engineering (ASE), Tool Track, IEEE/ACM, Sept. 2016, pages 756-761, Singapore, Singapore
IDA [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, DSCo-NG: A Practical Language Modeling Approach for Time Series Classification, 15th International Symposium on Intelligent Data Analysis (IDA), Oct. 2016, pages 1-13, Stockholm, Sweden
QRS [pdf] Matthieu Jimenez, Mike Papadakis, Tegawendé F. Bissyandé and Jacques Klein, Profiling Android Vulnerabilities, IEEE International Conference on Software Quality, Reliability and Security (QRS), IEEE, Aug. 2016, pages 222-229, Vienna, Austria
ICSME [pdf] Li Li, Tegawendé F. Bissyandé, Yves Le Traon and Jacques Klein, Accessing Inaccessible Android APIs: An Empirical Study, International Conference on Software Maintenance and Evolution (ICSME), IEEE, Oct. 2016, pages 411-422, Raleigh, North Carolina, USA, acceptance rate: 29% (37/127)
SEKE [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Time Series Classification with Discrete Wavelet Transformed Data: Insights from an Empirical Study, International Conference on Software Engineering & Knowledge Engineering (SEKE), Jul. 2016, pages 273-278, Redwood City, California, USA
SPLC [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Name Suggestions during Feature Identification: The VariClouds Approach, International Software Product Line Conference (SPLC), Short Paper Track, ACM, Sept. 2016, pages 119-123, Beijing, China
SPLC [pdf] Li Li, Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Mining Families of Android Applications for Extractive SPL Adoption, International Software Product Line Conference (SPLC), Vision Track, ACM, Sept. 2016, pages 271-275, Beijing, China
ISSTA [pdf] Li Li, Tegawendé F. Bissyandé, Damien Octeau and Jacques Klein, DroidRA: Taming Reflection to Support Whole-Program Analysis of Android Apps, ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2016, pages 318-329, Saarbrucken, Germany, acceptance rate: 25,17% (37/147)
DIMVA [pdf] Médéric Hurier, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, On the Lack of Consensus in Anti-Virus Decisions: Metrics and Insights on Building Ground Truths of Android Malware, 13th Conference on Detection of Intrusions and Malware & Vulnerability Assessment (DIMVA), Springer, LNCS 9721, Jul. 2016, pages 142-162, San Sebastian, Spain, acceptance rate: 31,81% (21/66)
MLDM [pdf] Daoyuan Li, Li Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, DSCo: A Language Modeling Approach for Time Series Classification, 12th International Conference on Machine Learning and Data Mining (MLDM), Springer, LNCS 9729, Jul. 2016, pages 294-310, New York City, USA
ICSR [pdf] Jabier Martinez, Tewfik Ziadi, Mike Papadakis, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Feature Location Benchmark for Software Families using Eclipse Community Releases, 15th International Conference on Software Reuse (ICSR), Springer, Jun. 2016, pages 267-283, Limassol, Cyprus
ICSR [pdf] Jörg Kienzle, Gunter Mussbacher, Omar Alam, Matthias Schöttle, Nicolas Belloir, Philippe Collet, Benoit Combemale, Julien Deantoni, Jacques Klein and Bernhard Rumpe, VCU: The Three Dimensions of Reuse, 15th International Conference on Software Reuse (ICSR), Springer, Jun. 2016, pages 122-137, Limassol, Cyprus
MSR [pdf] Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, AndroZoo: Collecting Millions of Android Apps for the Research Community, 13th International Conference on Mining Software Repositories (MSR), Data Showcase track, ACM, May 2016, pages 468-471, Austin, Texa, USA
SANER [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Parameter Values of Android APIs: A Preliminary Study on 100,000 Apps, ERA Track of the 23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), BEST PAPER AWARD, IEEE, Mar. 2016, pages 584-588, Osaka, Japan, acceptance rate: 37% (13/35)
SANER [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, An Investigation into the Use of Common Libraries in Android Apps, 23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), IEEE, Mar. 2016, pages 403-414, Osaka, Japan, acceptance rate: 37% (52/140)
ICIT [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Sylvain Kubler, Jacques Klein, Yves Le Traon, Profiling Household Appliance Electricity Usage with N-Gram Language Modeling, IEEE International Conference on Industrial Technology (ICIT2016), IEEE, Mar. 2016, pages 604-609, Taipei, Taiwan
SAC [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Yves Reckinger, Jacques Klein, Yves Le Traon, Near Real-Time Electric Load Approximation in Low Voltage Cables of Smart Grids with Models@run.time, The 31st ACM/SIGAPP Symposium on Applied Computing (SAC), Special Track on Smart Grid and Smart Technologies (SGST), ACM, Apr. 2016, pages 2119-2126, Pisa, Italy
POPL [pdf] Damien Octeau, Somesh Jha, Matthew Dering, Patrick McDaniel, Alexandre Bartel, Li Li, Jacques Klein, and Yves Le Traon, Combining Static Analysis with Probabilistic Models to Enable Market-Scale Android Inter-component Analysis, Symposium on Principles of Programming Languages (POPL), Jan. 2016, pages 469-484, St Petersburg, Florida, USA, acceptance rate: 23.32% (59/253)
SAC [pdf] Li Li, Daoyuan Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Towards a Generic Framework for Automating Extensive Analysis of Android Applications, The 31st ACM/SIGAPP Symposium on Applied Computing (SAC), ACM, Apr. 2016, pages 1460-1465, Pisa, Italy
EMSE [pdf] Kevin Allix, Tegawendé F. Bissyandé, Quentin Jérome, Jacques Klein, Radu State, and Yves Le Traon, Empirical Assessment of Machine Learning-Based Malware Detectors for Android: Measuring the Gap between In-the-Lab and In-the-Wild Validation Scenarios, Empirical Software Engineering (journal first), Springer, Feb. 2016, Volume 21, Issue 1 (First online: November 2014), pages 183–211
2015
IST [pdf] Phu H. Nguyen, Max Kramer, Jacques Klein, Yves Le Traon, An Extensive Systematic Review on the Model-Driven Development of Secure Systems, Information and Software Technology (IST), Elsevier, Dec. 2015 , Volume 68 Issue C, pages 62-81
ASE [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Automating the Extraction of Model-based Software Product Lines from Model Variants, 30th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE, Nov. 2015, pages 396-406, Lincoln, Nebraska, USA, acceptance rate: 20.76%, (60/289)
QRS [pdf] Li Li, Kevin Allix, Daoyuan Li, Alexandre Bartel, Tegawendé F. Bissyandé, and Jacques Klein, Potential Component Leaks in Android Apps: An Investigation into a New Feature Set for Malware Detection, IEEE International Conference on Software Quality, Reliability and Security (QRS), IEEE, Aug. 2015, pages 195-200, Vancouver, Canada
GECCO [pdf] Jabier Martinez, Gabriele Rossi, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Estimating and Predicting Average Likability on Computer-Generated Artwork Variants (2 pages paper), Proceedings of the Companion Publication of the 2015 on Genetic and Evolutionary Computation Conference (GECCO), ACM, Jul. 2015, pages 1431-1432, Madrid, Spain
SmartGridComm [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Yves Reckinger, Tejeddine Mouelhi, Jacques Klein, Yves Le Traon, Suspicious Electric Consumption Detection Based on Multi-Profiling Using Live Machine Learning, 6th IEEE International Conference on Smart Grid Communications (SmartGridComm), IEEE, Nov. 2015, pages 891-896, Miami, USA
MODELS [pdf] Phu H. Nguyen, Koen Yskout, Thomas Heyman, Jacques Klein, Riccardo Scandariato and Yves Le Traon, Model-Driven Security based on A Unified System of Security Design Patterns, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 246-255, Ottawa, Canada, acceptance rate: 26%, 35/132
MODELS [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Gregory Nain, Jacques Klein and Yves Le Traon, Beyond Discrete Modeling: A Continuous and Efficient Model for IoT, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 90-99, Ottawa, Canada, acceptance rate: 26%, 35/132
MODELS [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Gregory Nain, Jacques Klein and Yves Le Traon, Stream my Models: Reactive Peer-to-Peer Distributed Models@run.time, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 80-89, Ottawa, Canada, acceptance rate: 26%, 35/132
SPLC [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Bottom-Up Adoption of Software Product Lines - A Generic and Extensible Approach, International Software Product Line Conference (SPLC), ACM, Jul. 2015, pages 101-110, Nashville, US
IFIPSec [pdf] Li Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, ApkCombiner: Combining Multiple Android Apps to Support Inter-App Analysis, 30th International Information Security and Privacy Conference (IFIPSec), May 2015, pages 513-527, Hamburg, Germany, acceptance rate: 19.8%, 42/212
ICSE [pdf] Li Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Steven Arzt, Siegfried Rasthofer, Eric Bodden, Damien Octeau and Patrick McDaniel, IccTA: Detecting Inter-Component Privacy Leaks in Android Apps, The 37th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2015, pages 280-291, Firenze, Italy, acceptance rate: 18.5%, 84/452
Modelsward [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Johann Bourcier, and Jacques Klein, Polymer: Simplifying Complex Multi-Objective Optimizations Using A Model-Driven Approach, MODELSWARD - International Conference on Model-Driven Engineering and Software Development, Feb. 2015, Angers, France
SAC [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Jacques Klein and Yves Le Traon, Adaptive Blurring of Sensor Data for balancing Privacy and Utility for Ubiquitous Services, The 30th ACM/SIGAPP Symposium On Applied Computing (SAC), Software Platforms Track, Apr. 2015, Salamanca, Spain
ESSOS [pdf] Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Are Your Training Datasets Yet Relevant? - An Investigation into the Importance of Timeline in Machine Learning-Based Malware Detection, International Symposium on Engineering Secure Software and Systems (ESSOS), Springer, LNCS 8978, Mar. 2015, Milan, Italy, acceptance rate: 27%, 11/41
2014
TSE [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon, Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 7, Jul. 2014, pages 650 - 670
TSE [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Static Analysis for Extracting Permission Checks of a Large Scale Framework: The Challenges And Solutions for Analyzing Android, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 6, Jun. 2014, pages 617-632
PLDI [pdf] Steven Arzt, Siegfried Rasthofer, Christian Fritz, Eric Bodden, Alexandre Bartel, Jacques Klein, Yves Le Traon, Damien Octeau, and Patrick McDaniel, FlowDroid: Precise Context, Flow, Field, Object-sensitive and Lifecycle-aware Taint Analysis for Android Apps, ACM SIGPLAN conference on Programming Language Design and Implementation (PLDI), Jun. 2014, pages 259-269, Edinburgh, UK, acceptance rate: 18%, 52/287
SEKE [pdf] Thomas Hartmann, François Fouquet, Brice Morin, Gregory Nain, Jacques Klein and Yves Le Traon, Reasoning at Runtime using time-distorted Contexts: A Models@run.time based Approach, International Conference on Software Engineering & Knowledge Engineering (SEKE), (best paper awards), Jul. 2014, pages 586-591, Vancouver, Canada
TrustCom [pdf] Li Li, Alexandre Bartel, Jacques Klein, Yves Le Traon, Automatically Exploiting Potential Component Leaks in Android Applications, The 13th IEEE International Conference on Trust, Security and Privacy in Computing and Communications (IEEE TrustCom-14), IEEE, Sept. 2014, pages 388-397, Beijing, China, acceptance rate: 31.7%, 73/230
SmartGridComm [pdf] Thomas Hartmann, François Fouquet, Jacques Klein, Yves Le Traon, Alexander Pelov, Laurent Toutain, Tanguy Ropitault, Generating Realistic Smart Grid Communication Topologies Based on Real-Data, 5th IEEE International Conference on Smart Grid Communications (SmartGridComm 2014), IEEE, Nov. 2014, pages 428-433, Venice, Italy
MODELS [pdf] Thomas Hartmann, François Fouquet, Gregory Nain, Brice Morin, Jacques Klein, Olivier Barais, Yves Le Traon, A Native Versioning Concept to Support Historized Models at Runtime, ACM/IEEE 17th International Conference on Model Driven Engineering Languages and Systems (MODELS 2014), Springer, LNCS 8767, Oct. 2014, pages 252-268, Valencia, Spain, acceptance rate: 24%, 30/126
VISSOFT [pdf] Jabier Martinez, Tewfik Ziadi, Raul Mazo, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Feature Relations Graphs: A Visualisation Paradigm for Feature Constraints in Software Product Lines, IEEE Working Conference on Software Visualization (VISSOFT), Oct. 2014, pages 50-59, Victoria, BC, Canada
COMPSAC [pdf] Kevin Allix, Quentin Jérome, Tegawendé F. Bissyandé, Jacques Klein, Radu State and Yves Le Traon, A forensic analysis of Android Malware - How is Malware Written and How it Could be Detected?, IEEE Computer Software and Applications Conference (COMPSAC 2014), Jul. 2014, Vasteras, Sweden, acceptance rate: 22%, ?/?
BookChapter [pdf] Levi Lucio, Qin Zhang, Phu H. Nguyen, Moussa Amrani, Jacques Klein, Hans Vangheluwe, Yves Le Traon, Advances in Model-Driven Security, Advances in Computers, in Atif Memon (Ed.), Volume 93, 2014, pages 103-152
TAOSD [pdf] Phu H. Nguyen, Gregory Nain, Jacques Klein, Tejeddine Mouelhi, Yves Le Traon, Modularity and Dynamic Adaptation of Flexibly Secure Systems: Model-Driven Adaptive Delegation in Access Control Management, Transactions on Aspect-Oriented Software Development (TAOSD), Springer, LNCS 8400, 2014, pages 109-144
ECMFA [pdf] Jabier Martinez, Tewfik Ziadi, Jacques Klein, Yves Le Traon, Identifying and Visualising Commonality and Variability in Model Variants, European Conference on Modelling Foundations and Applications (ECMFA), Springer, LNCS 8569, Jul. 2014, pages 117-131, York, United Kingdom, acceptance rate: 28%, 14/49
CODASPY [pdf] Kevin Allix, Tegawendé F. Bissyandé, Quentin Jérome, Jacques Klein, Radu State, Yves Le Traon, Large-scale machine learning-based malware detection: confronting the 10-fold cross validation scheme with reality, ACM Conference on Data and Application Security and Privacy (CODASPY), (short paper/poster), Mar. 2014, pages 163-166, San Antonio, TX, USA
[pdf] Thomas Hartmann, François Fouquet, Jacques Klein, Gregory Nain, Yves Le Traon, Reactive Security for Smart Grids using Models@run.time-Based Simulation and Reasoning, Second Open EIT ICT Labs Workshop on Smart Grid Security, Feb. 2014, Munich, Germany
[pdf] Phu H. Nguyen, Jacques Klein, Yves Le Traon, Model-Driven Security with A System of Aspect-Oriented Security Design Patterns, 2nd Workshop on View-Based, Aspect-Oriented and Orthographic Software Modelling, Jul. 2014, York, United Kingdom
2013
APSEC [pdf] Phu H. Nguyen, Jacques Klein, Max Kramer, Yves Le Traon, A Systematic Review of Model-Driven Security, 20th Asia-Pacific Software Engineering Conference Proceedings (APSEC), IEEE, Dec. 2013, pages 432-441, Bangkok, Thailand
ISSRE [pdf] Tegawendé F. Bissyandé, David Lo, Lingxiao Jiang, Laurent Reveillere, Jacques Klein, Yves Le Traon, Got Issues? Who Cares About It? A Large Scale Investigation of Issue Trackers from GitHub, 24th International Symposium on Software Reliability Engineering (ISSRE), IEEE, Nov. 2013, pages 188-197, Pasadena, CA, USA, acceptance rate: 35%, 46/131
Usenix Security [pdf] Damien Octeau, Patrick McDaniel, Somesh Jha, Alexandre Bartel, Eric Bodden, Jacques Klein, Yves Le Traon, Effective Inter-Component Communication Mapping in Android with Epicc: An Essential Step Towards Holistic Security Analysis, Usenix Security, USENIX Association, Aug. 2013, pages 543-558, Washington D.C., USA, acceptance rate: 16%, 44/277
SPLC [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Multi-objective Test Generation for Software Product Lines, 17th International Software Product Line Conference (SPLC), ACM, Aug. 2013, pages 62-71, Tokyo, Japan, acceptance rate: 33%, 18/55
ICMT [pdf] Max E. Kramer, Jacques Klein, Jim R. H. Steel, Brice Morin, Jörg Kienzle, Olivier Barais, and Jean-Marc Jézéquel, Achieving Practical Genericity in Model Weaving through Extensibility, International Conference on Model Transformation (ICMT), Springer, LNCS 7909, Jun. 2013, pages 108-124, Budapest, Hungary, acceptance rate: 21%, 12/58
NIER@ICSE [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Towards Automated Testing and Fixing of Re-engineered Feature Models, International Conference of Software Engineering, New Ideas & Emerging Results Track (NIER@ICSE), IEEE Press, May 2013, pages 1245-1248, San Francisco, USA, acceptance rate: 22%, 31/143
AOSD [pdf] Phu H. Nguyen, Gregory Nain, Jacques Klein, Tejeddine Mouelhi and Yves Le Traon, Model-Driven Adaptive Delegation, 12th International Conference on Aspect Oriented Software Development - AOSD 2013, ACM, Mar. 2013, pages 61-72, Fukuoka, Japan, acceptance rate: 27%, 17/62
AFRICOMM [pdf] Tegawendé F. Bissyandé, Daouda Ahmat, Jonathan Ouoba, Gertjan van Stam, Jacques Klein, Yves Le Traon, Sustainable ICT4D in Africa: Where Do We Go from Here?, EAI International Conference on e‐Infrastructure and e‐Services for Developing Countries, AFRICOMM 2013, 2013, pages 95-103, Blantyre, Malawi
AFRICOMM [pdf] Miguel A. Olivares-Méndez, Tegawendé F. Bissyandé, Kannan Somasundar, Jacques Klein, Holger Voos, Yves Le Traon, The NOAH Project: Giving a Chance to Threatened Species in Africa with UAVs, EAI International Conference on e‐Infrastructure and e‐Services for Developing Countries, AFRICOMM 2013, 2013, pages 198-208, Blantyre, Malawi
AMOST@ICST [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Assessing Software Product Line Testing via Model-based Mutation: An Application to Similarity Testing, th Workshop on Advances in Model Based Testing (A-MOST 2013), Co-located with the 6th IEEE International Conference on Software Testing, Verification and Validation (ICST 2013), Mar. 2013, Luxembourg, Luxembourg
Tool@SPLC [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, PLEDGE: A Product Line Editor and Test Generation Tool, Demonstrations and Tools, 17th International Software Product Line Conference (SPLC 2013), Aug. 2013, pages 126-129, Tokyo, Japan
TechReport [pdf] Christian Fritz, Steven Arzt, Siegfried Rasthofer, Eric Bodden, Alexandre Bartel, Jacques Klein, Yves Le Traon, Damien Octeau, Patrick McDaniel, Highly Precise Taint Analysis for Android Applications, EC SPRIDE Technical Report TUD-CS-2013-0113, 2013
2012
ASE [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Automatically Securing Permission-Based Software by Reducing the Attack Surface: An Application to Android, IEEE/ACM International Conference on Automated Software Engineering, ASE 2012, ACM, Sept. 2012, pages 274-277, Essen, Germany, acceptance rate: 33%, 45/138, 21 long+ 24 short
SQJ [pdf] Gilles Perrouin, Sebastian Oster, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon, Pairwise testing for software product lines: Comparison of two approaches, Software Quality Journal (SQJ), Springer, Volume 20, Sept. 2012, pages 605-643
TechReport [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Kevin Allix, Yves Le Traon, Improving Privacy on Android Smartphones Through In-Vivo Bytecode Instrumentation, Technical Report, ISBN: 978-2-87971-111-9, University of Luxembourg, May 2012
ERCIM [pdf] Tom Mens, Jacques Klein, Evolving Software - Introduction to the Special Theme, ERCIM News, 2012
SOAP [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Dexpler: Converting Android Dalvik Bytecode to Jimple for Static Analysis with Soot, ACM Sigplan International Workshop on the State Of The Art in Java Program Analysis (SOAP), Jun. 2012, Beijing, China
NIER@ICSE [pdf] Gilles Perrouin, Brice Morin, Franck Chauvel, Franck Fleurey, Jacques Klein, Yves Le Traon, Olivier Barais, Jean-Marc Jézéquel, Towards Flexible Evolution of Dynamically Adaptive Systems, International Conference of Software Engineering, New Ideas & Emerging Results Track (NIER@ICSE), Jun. 2012, pages 1353-1356, Zurich, Switzerland, acceptance rate: 18%, 26/147
DSAL@AOSD [pdf] Max Kramer, Jacques Klein, Jim R. H. Steel, Building Specifications as a Domain-Specific Aspect Language, Seventh Workshop on Domain-Specific Aspect Languages, DSAL’12@AOSD, Mar. 2012, Postdam, Germany
2011
Vary@Models [pdf] Paul Istoan, Jacques Klein, Gilles Perrouin, Jean-Marc Jézéquel, A Metamodel-based Classification of Variability Modeling Approaches, VARY International Workshop @MODELS2011, Oct. 2011, New Zeeland
TechReport
[pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Automatically Securing Permission-Based Software by Reducing the Attack Surface: An Application to Android, Technical Report, University of Luxembourg, Oct. 2011
ECMFA [pdf] Mauricio Alferez, Nuno Amalio, Selim Ciraci, Franck Fleurey, Jörg Kienzle, Jacques Klein, Max Kramer, Sebastien Mosser, Gunter Mussbacher, Ella Roubtsova and Gefei Zhang, Aspect-Oriented Model Development at Different Levels of Abstraction, Seventh European Conference on Modelling Foundations and Applications (ECMFA 2011), Jun. 2011, pages 361-376, Birmingham, UK, acceptance rate: 36%, 19/53
MUTATION [pdf] Alexandre Bartel, Benoit Baudry, Freddy Munoz, Jacques Klein, Tejeddine Mouelhi and Yves Le Traon, Model Driven Mutation Applied to Adaptative Systems Testing, Mutation 2011 (@ICST), Mar. 2011, pages 408-413, Berlin, Germany, acceptance rate: 50%, 10/20
VAMOS [pdf] Paul Istoan, Nicolas Biri, Jacques Klein, Issues in Model-Driven Behavioural Product Derivation, Fifth International Workshop on Variability Modelling of Software-intensive Systems (Vamos 2011), ACM, 2011, pages 69-78, Namur, Belgium, acceptance rate: 55%, 21/38
2010
TAOSD [pdf] Jörg Kienzle, Wisam Al Abed, Franck Fleurey, Jean-Marc Jézéquel and Jacques Klein, Aspect-Oriented Design with Reusable Aspect Models, Transactions on Aspect-Oriented Software Development (TAOSD) - journal first, Springer, LNCS 6210, 2010, pages 272-320
ICST [pdf] Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry and Yves Le Traon, Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines, Third International Conference on Software Testing, Verification and Validation (ICST 2010), IEEE Computer Society, Apr. 2010, pages 459-468, Paris, France, acceptance rate: 26%, 41/154
MODELS [pdf] Brice Morin, Jacques Klein, Jörg Kienzle and Jean-Marc Jézéquel, Flexible Model Element Introduction Policies for Aspect-Oriented Modeling, 13th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS 2010), Springer LNCS 6395, Oct. 2010, pages 63-77, Oslo, Norway, acceptance rate: 21%, 43/207
2009
MODELS [pdf] Jacques Klein, Jörg Kienzle, Brice Morin, Jean-Marc Jézéquel, Aspect Model Unweaving, 12th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS 2009), Springer, LNCS 5795, Oct. 2009, pages 514-530, Denver, Colorado, USA, acceptance rate: 16%, 34/211
AOSD [pdf] Jörg Kienzle, Wisam Al Abed, Jacques Klein, Aspect-Oriented Multi-View Modeling, 8th International Conference on Aspect Oriented Software Development (AOSD.09), ACM, Mar. 2009, pages 87-98, Charlotteville, Virginia, USA, acceptance rate: 22%, 19/86
2008
SPLC [pdf] Gilles Perrouin, Jacques Klein, Nicolas Guelfi, Jean-Marc Jézéquel, Reconciling Automation and Flexibility in Product Derivation, 12th International Software Product Line Conference (SPLC 2008), IEEE, Sept. 2008, pages 339-348, Limerick, Ireland, acceptance rate: 30%, 33/110
ICCBSS [pdf] Olivier Barais, Jacques Klein, Benoit Baudry, Andrew Jackson, Siobhan Clarke, Composing Multi-View Aspect Models, 7th IEEE International Conference on Composition Based Software Systems (ICCBSS), Feb. 2008, Madrid, Spain
EA@ICSE [pdf] Brice Morin, Jacques Klein, Olivier Barais, Jean-Marc Jézéquel, A Generic Weaver for supporting Product Lines, Early Aspects Workshop at ICSE, ACM, May 2008, pages 11-18, Leipzig, Germany
2007
TAOSD [pdf] Jacques Klein, Franck Fleurey and Jean-Marc Jézéquel, Weaving Multiple Aspects in Sequence Diagrams, Transactions on Aspect-Oriented Software Development (TAOSD) - journal first, 2007, pages 167-199
AOM@Models [pdf] Jacques Klein and Jörg Kienzle, Reusable Aspect Models, 11th Workshop on Aspect Oriented Modeling, AOM at Models’07, Sept. 2007, Nashville, USA
IDM
[pdf] Jacques Klein, Benoit Baudry, Olivier Barais, Andrew Jackson, Introduction du test dans la modélisation par aspects, 3ème journées sur l'Ingénierie Dirigée par les Modèles (IDM'07), Mar. 2007, Toulouse, France
2006
PhD thesis [pdf] Jacques Klein, Aspects Comportememtaux et Tissage, PhD Thesis, University of Rennes 1, Dec. 2006, Rennes, France
LMO [pdf] Jacques Klein and Franck Fleurey, Tissage d'Aspects Comportementaux, Langages et Modèles à Objets (LMO'06), Mar. 2006, Nimes, France, acceptance rate: 38%, 13/34
[pdf] Andrew Jackson, Jacques Klein, Benoit Baudry and Siobhan Clarke, KerTheme: Testing Aspect Oriented Models, Workshop on Integration of Model Driven Development and Model Driven Testing at EC-MDA, Jul. 2006, Bilbao, Spain
MDSD@Ecoop [pdf] Andrew Jackson, Jacques Klein, Benoit Baudry and Siobhan Clarke, Testing Executable Themes, Workshop on Models and Aspects - Handling Crosscutting Concerns in MDSD at ECOOP 2006, Jul. 2006, Nantes, France
AOSD [pdf] Jacques Klein, Loic Hélouët and Jean-Marc Jézéquel, Semantic-based Weaving of Scenarios, 5th International Conference on Aspect Oriented Software Development (AOSD.06), ACM, Mar. 2006, pages 87-98, Bonn, Germany, acceptance rate: 21%, 20/95
2005
EA@SPLC [pdf] Jacques Klein and Jean-Marc Jézéquel, Problems of the Semantic-based Weaving of Scenarios, Aspects and Software Product Lines: An Early Aspects Workshop at SPLC Europe 2005, Sep. 2005, Rennes, France
MDSD@Ecoop [pdf] Jacques Klein, Jean-Marc Jézéquel and Noel Plouzeau, Weaving Behavioural Models, First Workshop on Models and Aspects - Handling Crosscutting Concerns in MDSD at Eccop 05, Jul. 2005, Glasgow, United Kingdom
2004
FMICS [pdf] Jacques Klein, Benoit Caillaud, and Loic Hélouët, Merging scenarios, Formal Methods for Industrial Critical Systems (FMICS), vol. 133, ENTCS, Sept. 2004, pages 209--226, Linz, Austria, acceptance rate: 58%, 17/29
MDAFA [pdf] Jacques Klein and Noel Plouzeau, Transformation of behavioral models based on compositions of sequence diagrams, Model Driven Architecture: Foundations and Applications 2004 (MDAFA), Jun. 2004, page 255, Linkoping, Sweden