Full List of Publication Ranked Per Year

    2020

  1. JSS
    [pdf] Kui Liu, Li Li, Anil Koyuncu, Dongsun Kim, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé, A Critical Review on the Evaluation of Automated Program Repair Systems, Journal of Systems and Software, Elsevier, Accepted for publication on Sep. 8, 2020

  2. ASE
    [pdf] Haoye Tian, Kui Liu, Abdoul Kader Kaboré, Anil Koyuncu, Li Li, Jacques Klein, Tegawendé F. Bissyandé, Evaluating Representation Learning of Code Changes fo Predicting Patch Correctness in Program Repair, 35th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE/ACM, Sep. 2020, To appear, Melbourne, Australia (Virtual Event), acceptance rate: 22.5% (93/414)

  3. KDD
    [pdf] Salah Ghamizi, Renaud Rwemalika, Maxime Cordy, Lisa Veiber, Tegawendé F. Bissyandé, Mike Papadakis, Jacques Klein and Yves Le Traon, Data-driven Simulation and Optimization for Covid-19 ExitStrategies, KDD 2020 (Health Day, special track on AI For Covid-19), ACM, Aug. 2020, To appear, San Diego, CA, USA (Virtual Event), acceptance rate: best KDD paper for AI for COVID-19

  4. FSE
    [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Borrowing Your Enemy’s Arrows: the Case of Code Reuse in Android via Direct Inter-app Code Invocation, 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2020), Nov. 2020, To appear, Sacramento, CA, United States (Virtual Event), acceptance rate: 28% (101/360)

  5. OpML
    [pdf] Lisa Veiber, Kevin Allix, Yusuf Arslan, Tegawendé F. Bissyandé, Jacques Klein, Challenges Towards Production-Ready Explainable Machine Learning, 2020 USENIX Conference on Operational Machine Learning, Usenix, July 2020, To appear, Santa Clara, CA, USA (Virtual Event)

  6. EMSE
    [pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus, Yves Le Traon, FixMiner: Mining Relevant Fix Patterns for Automated Program Repair, Empirical Software Engineering (journal first), Springer, Vol. 25, Mar. 2020, pages 1980-2024

  7. WWW
    [pdf] Tianming Liu, Haoyu Wang, Li Li, Xiapu Luo, Feng Dong, Yao Guo, Liu Wang, Tegawendé F. Bissyandé and Jacques Klein, MadDroid: Characterising and Detecting Devious Ad Content for Android Apps, The Web Conference 2020 (the WebConf, formerly WWW), ACM, April 2020, pages 1715-1726, Taipei, Taiwan (Virtual Event), acceptance rate: 19.22% (217/1129)

  8. ICSE
    [pdf] Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, and Yves Le Traon, On the Efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs, 42th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2020, To appear, Seoul, South Korea (Virtual Event), acceptance rate: 20.9% (129/617)

  9. EMSE
    [pdf] Li Li, Jun Gao, Tegawendé F. Bissyandé, Lei Ma, Xin Xia and Jacques Klein, CDA: Characterising Deprecated Android APIs, Empirical Software Engineering, Springer, Vol. 25, Jan. 2020 (Accepted for publication on Aug. 05, 2019), pages 2058-2098

  10. 2019

  11. Trans. on Reliability
    [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Understanding the Evolution of Android App Vulnerabilities, IEEE Transactions on Reliability (journal first), IEEE, (accepted for publication on November 15, 2019), Early Access on Dec. 2019

  12. ICSME
    [pdf] Mohamed A. Oumaziz, Jean-Rémy Falleri, Xavier Blanc, Tegawendé F. Bissyandé and Jacques Klein, Handling duplicates in Dockerfiles families: Learning from experts, 35th IEEE International Conference on Software Maintenance and Evolution (ICSME), IEEE, Oct. 2019, pages 524-535, Cleveland, Ohio, USA, acceptance rate: 22,96% (31/135)

  13. FSE
    [pdf] Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon, iFixR: Bug Report driven Program Repair, 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2019), ACM, Aug. 2019, pages 314-325, Tallinn, Estonia, acceptance rate: 24.4% (74/303)

  14. ICECCS
    [pdf] Jun Gao, Li Li, Tegawendé F. Bissyandé and Jacques Klein, On the Evolution of Mobile App Complexity, 24th International Conference on Engineering of Complex Computer Systems (ICECCS), Nov. 2019, pages 200-209, Hong Kong, acceptance rate: 23,86% (21/88)

  15. ISSTA
    [pdf] Pingfan Kong, Li Li, Jun Gao, Tegawendé F. Bissyandé, Jacques Klein, Mining Android Crash Fixes in the Absence of Issue- and Change-Tracking Systems, The International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2019, pages 78-89, Beijing, China, acceptance rate: 22.5% (32/142)

  16. JSS
    [pdf] Li Li, Timothée Riom, Tegawendé F. Bissyandé, Haoyu Wang, Jacques Klein, and Yves Le Traon, Revisiting the Impact of Common Libraries for Android-related Investigations, Journal of Systems and Software, Elsevier, Aug. 2019 (accepted for publication on Apr. 25, 2019), pages 157-175, Volume 154

  17. MSR
    [pdf] Jun Gao, Pingfan Kong, Li Li, Tegawendé F. Bissyandé and Jacques Klein, Negative Results on Mining Crypto-API Usage Rules in Android Apps, 16th IEEE/ACM International Conference on Mining Software Repositories (MSR), IEEE, May 2019, pages 388-398, Montreal, Canada, acceptance rate: 25.4%, (32/126)

  18. TSE
    [pdf] Li Li, Tegawendé F. Bissyandé, and Jacques Klein, Rebooting Research on Detecting Repackaged Android Apps: Literature Review and Benchmark, IEEE Transactions on Software Engineering (journal first), IEEE, Accepted for publication on Feb. 19, 2019

  19. SANER
    [pdf] Jun Gao, Li Li, Pingfan Kong, Tegawendé F. Bissyandé and Jacques Klein, Should You Consider Adware as Malware in Your Study?, ERA Track of the 26rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), IEEE, Feb. 2019, pages 604-608, Hangzhou, China, acceptance rate: 34.78%, (8/23)

  20. TIFS
    [pdf] Alexandre Bartel, Jacques Klein and Yves Le Traon, MUSTI : Prevention of Invalid Object Initialization Attacks at Runtime, IEEE Transactions on Information Forensics and Security (journal first), IEEE, vol. 14, no. 8, Aug. 2019 (Accepted for publication on January 16, 2019), Pages 2167-2178

  21. JCST
    [pdf] Li Li, Tegawendé F. Bissyandé, Haoyu Wang and Jacques Klein, On Identifying and Explaining Similarities in Android Apps, Journal of Computer Science and Technology, Springer, Vol.34 No.2, Mar. 2019, pages 437–455

  22. ICST
    [pdf] Kui Liu, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein and Yves Le Traon, You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems, 12th IEEE International Conference on Software Testing, Verification and Validation (ICST 2019), IEEE, Apr. 2019, pages 102-113, Xi'an, China, acceptance rate: 28.18% (31/110)

  23. Trans. on Reliability
    [pdf] Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein, Automated Testing of Android Apps: A Systematic Literature Review, IEEE Transactions on Reliability (journal first), Volume 68, Issue 1, IEEE, Mar. 2019 (accepted for publication on August 9, 2018), pages 45-66

  24. 2018

  25. ISSRE
    [pdf] Li Li, Tegawendé F. Bissyandé and Jacques Klein, MoonlightBox: Mining Android API Histories for Uncovering Release-time Inconsistencies, The 29th IEEE International Symposium on Software Reliability Engineering (ISSRE), IEEE, Oct. 2018, pages 212-223, Memphis, TN, USA, acceptance rate: 23.96% (23/96)

  26. IST
    [pdf] Jabier Martinez, Tewfik Ziadi, Mike Papadakis, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Feature location benchmark for extractive software product line adoption research using realistic and synthetic Eclipse variants, Information and Software Technology (journal first), Elsevier, Dec. 2018, Volume 104, pages 46-59

  27. FSE
    [pdf] Feng Dong, Haoyu Wang, Li Li, Yao Guo, Tegawendé F. Bissyandé, Tianming Liu, Guoai Xu and Jacques Klein, FraudDroid: Automated Ad Fraud Detection for Android Apps, ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2018), ACM, Nov. 2018, pages 257-268, Lake Buena Vista, Florida, United States, acceptance rate: 21.1% (61/289)

  28. ISSTA
    [pdf] Li Li, Tegawendé F. Bissyandé, Haoyu Wang and Jacques Klein, CiD: Automating the Detection of API-related Compatibility Issues in Android Apps, The International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2018, pages 153-163, Amsterdam, Netherlands, acceptance rate: 23.5% (31/132)

  29. MSR
    [pdf] Li Li, Jun Gao, Tegawendé F. Bissyandé, Lei Ma, Xin Xia, Jacques Klein, Characterising Deprecated Android APIs, 15th International Conference on Mining Software Repositories (MSR 2018), ACM, May 2018, pages 254-264, Gothenburg, Sweden

  30. ICSR
    [pdf] Jabier Martinez, Jean-Sébastien Sottet, Alfonso García-Frey, Tegawendé F. Bissyandé, Tewfik Ziadi, Jacques Klein, Paul Temple, Mathieu Acher and Yves Le Traon, Towards Estimating and Predicting User Perception on Software Product Variants, The 17th International Conference on Software Reuse, Springer, LNCS, volume 10826, May 2018, pages 23-40, Madrid, Spain

  31. ICSE
    [pdf] Kisub Kim, Dongsun Kim, Tegawendé F. Bissyandé, Eunjong Choi, Li Li, Jacques Klein and Yves Le Traon, FaCoY – A Code-to-Code Search Engine, 40th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2018, pages 946-957, Gothenburg, Sweden, acceptance rate: 20.9% (105/502)

  32. EDBT
    [pdf] Daoyuan Li, Jessica Lin, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Extracting Statistical Graph Features for Accurate and Efficient Time Series Classification, 21st International Conference on Extending Database Technology (EDBT), Mar. 2018, page 205-216

  33. EMSE
    [pdf] Raphael Sirres, Tegawendé F. Bissyandé, Dongsun Kim, David Lo, Jacques Klein, Kisub Kim, Yves Le Traon, Augmenting and Structuring User Queries to Support Efficient Free-Form Code Search, Empirical Software Engineering (journal first), Springer, Jan. 2018, Volume 90, pages 27-39

  34. 2017

  35. JCST
    [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Haipeng Cai, David Lo, Yves Le Traon, On Locating Malicious Code in Piggybacked Android Apps, Journal of Computer Science and Technology, Springer, Nov. 2017, Volume 32, Issue 6, pages 1108–1124

  36. TrustCom
    [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein, SimiDroid: Identifying and Explaining Similarities in Android Apps, 16th IEEE International Conference on Trust, Security and Privacy in Computing and Communications (IEEE TrustCom-17), IEEE, Aug. 2017, pages 136-143, Sydney, Australia

  37. IST
    [pdf] Xinli Yang, David Lo, Li Li, Xin Xia, Tegawendé F. Bissyandé and Jacques Klein, Comprehending Malicious Android Apps By Mining Topic-Specific Data Flow Signatures, Information and Software Technology (journal first), Elsevier, Volume 88, pages 67-95

  38. ISSTA
    [pdf] Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus and Yves Le Traon, Impact of Tool Support in Patch Construction, The International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2017, pages 237-248, Santa Barbara, USA, acceptance rate: 26% (31/118)

  39. BookChapter
    [pdf] Jabier Martinez, Jean-Sébastien Sottet, Alfonso Garcıa Frey, Tewfik Ziadi, Tegawendé F. Bissyandé, Jean Van- derdonckt, Jacques Klein, and Yves Le Traon, Variability Management and Assessment for User Interface Design, Human Centered Software Product Lines. Human-Computer Interaction Series, Springer, 2017, pages 81–106

  40. MobileSoft
    [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Haipeng Cai, David Lo, Yves Le Traon, Automatically Locating Malicious Packages in Piggybacked Android Apps, 4th IEEE/ACM International Conference on Mobile Software Engineering and Systems (MobileSoft), IEEE, May 2017, pages 170-174, Buenos Aires, Argentina

  41. IST
    [pdf] Li Li, Tegawendé F. Bissyandé, Mike Papadakis, Siegfried Rasthofer, Alexandre Bartel, Damien Octeau, Jacques Klein, Yves Le Traon, Static Analysis of Android Apps: A Systematic Literature Review, Information and Software Technology (journal first), Elsevier, Volume 90, pages 67-95

  42. MSR
    [pdf] Médéric Hurier, Tegawendé F. Bissyandé, Yves Le Traon, Jacques Klein, Guillermo Suarez-Tangil, Santanu Kumar Dash and Lorenzo Cavallaro, Euphony: Harmonious Unification of Cacophonous Anti-Virus Vendor Labels for Android Malware, The 14th International Conference on Mining Software Repositories (MSR), IEEE/ACM, May 2017, pages 425-435, Buenos Aires, Argentina, acceptance rate: 30.6% (37/121)

  43. TIFS
    [pdf] Li Li, Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, David Lo, Lorenzo Cavallaro, Understanding Android App Piggybacking: A Systematic Study of Malicious Code Grafting, IEEE Transactions on Information Forensics and Security (journal first), Volume: 12, Issue: 6, IEEE, June 2017, online Jan. 2017, pages 1269-1284

  44. SAC
    [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Sensing by Proxy in Buildings with Agglomerative Clustering of Indoor Temperature Movements, The 32st ACM/SIGAPP Symposium on Applied Computing (SAC), IoT Track, ACM, Apr. 2017, pages 477-484, Marrakesh, Morocco

  45. 2016

  46. IJSEKE
    [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Time Series Classification with Discrete Wavelet Transformed Data, International Journal of Software Engineering and Knowledge Engineering, Volume 26, Issue 09n10, November & December 2016 (Accepted for publication in October 2016), pages 1361–1377

  47. ASE
    [pdf] Li Li, Tegawendé F. Bissyandé, Damien Octeau and Jacques Klein, Reflection-Aware Static Analysis of Android Apps, 31st IEEE/ACM International Conference on Automated Software Engineering (ASE), Tool Track, IEEE/ACM, Sept. 2016, pages 756-761, Singapore, Singapore

  48. IDA
    [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, DSCo-NG: A Practical Language Modeling Approach for Time Series Classification, 15th International Symposium on Intelligent Data Analysis (IDA), Oct. 2016, pages 1-13, Stockholm, Sweden

  49. QRS
    [pdf] Matthieu Jimenez, Mike Papadakis, Tegawendé F. Bissyandé and Jacques Klein, Profiling Android Vulnerabilities, IEEE International Conference on Software Quality, Reliability and Security (QRS), IEEE, Aug. 2016, pages 222-229, Vienna, Austria

  50. ICSME
    [pdf] Li Li, Tegawendé F. Bissyandé, Yves Le Traon and Jacques Klein, Accessing Inaccessible Android APIs: An Empirical Study, International Conference on Software Maintenance and Evolution (ICSME), IEEE, Oct. 2016, pages 411-422, Raleigh, North Carolina, USA, acceptance rate: 29% (37/127)

  51. SEKE
    [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Time Series Classification with Discrete Wavelet Transformed Data: Insights from an Empirical Study, International Conference on Software Engineering & Knowledge Engineering (SEKE), Jul. 2016, pages 273-278, Redwood City, California, USA

  52. SPLC
    [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Name Suggestions during Feature Identification: The VariClouds Approach, International Software Product Line Conference (SPLC), Short Paper Track, ACM, Sept. 2016, pages 119-123, Beijing, China

  53. SPLC
    [pdf] Li Li, Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Mining Families of Android Applications for Extractive SPL Adoption, International Software Product Line Conference (SPLC), Vision Track, ACM, Sept. 2016, pages 271-275, Beijing, China

  54. ISSTA
    [pdf] Li Li, Tegawendé F. Bissyandé, Damien Octeau and Jacques Klein, DroidRA: Taming Reflection to Support Whole-Program Analysis of Android Apps, The International Symposium on Software Testing and Analysis (ISSTA), ACM, Jul. 2016, pages 318-329, Saarbrucken, Germany, acceptance rate: 25,17% (37/147)

  55. DIMVA
    [pdf] Médéric Hurier, Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, On the Lack of Consensus in Anti-Virus Decisions: Metrics and Insights on Building Ground Truths of Android Malware, 13th Conference on Detection of Intrusions and Malware & Vulnerability Assessment (DIMVA), Springer, LNCS 9721, Jul. 2016, pages 142-162, San Sebastian, Spain, acceptance rate: 31,81% (21/66)

  56. MLDM
    [pdf] Daoyuan Li, Li Li, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, DSCo: A Language Modeling Approach for Time Series Classification, 12th International Conference on Machine Learning and Data Mining (MLDM), Springer, LNCS 9729, Jul. 2016, pages 294-310, New York City, USA

  57. ICSR
    [pdf] Jabier Martinez, Tewfik Ziadi, Mike Papadakis, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Feature Location Benchmark for Software Families using Eclipse Community Releases, 15th International Conference on Software Reuse (ICSR), Springer, Jun. 2016, pages 267-283, Limassol, Cyprus

  58. ICSR
    [pdf] Jörg Kienzle, Gunter Mussbacher, Omar Alam, Matthias Schöttle, Nicolas Belloir, Philippe Collet, Benoit Combemale, Julien Deantoni, Jacques Klein and Bernhard Rumpe, VCU: The Three Dimensions of Reuse, 15th International Conference on Software Reuse (ICSR), Springer, Jun. 2016, pages 122-137, Limassol, Cyprus

  59. MSR
    [pdf] Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, AndroZoo: Collecting Millions of Android Apps for the Research Community, 13th International Conference on Mining Software Repositories (MSR), Data Showcase track, ACM, May 2016, pages 468-471, Austin, Texa, USA

  60. SANER
    [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Parameter Values of Android APIs: A Preliminary Study on 100,000 Apps, ERA Track of the 23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), BEST PAPER AWARD, IEEE, Mar. 2016, pages 584-588, Osaka, Japan, acceptance rate: 37% (13/35)

  61. SANER
    [pdf] Li Li, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, An Investigation into the Use of Common Libraries in Android Apps, 23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER), IEEE, Mar. 2016, pages 403-414, Osaka, Japan, acceptance rate: 37% (52/140)

  62. ICIT
    [pdf] Daoyuan Li, Tegawendé F. Bissyandé, Sylvain Kubler, Jacques Klein, Yves Le Traon, Profiling Household Appliance Electricity Usage with N-Gram Language Modeling, IEEE International Conference on Industrial Technology (ICIT2016), IEEE, Mar. 2016, pages 604-609, Taipei, Taiwan

  63. SAC
    [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Yves Reckinger, Jacques Klein, Yves Le Traon, Near Real-Time Electric Load Approximation in Low Voltage Cables of Smart Grids with Models@run.time, The 31st ACM/SIGAPP Symposium on Applied Computing (SAC), Special Track on Smart Grid and Smart Technologies (SGST), ACM, Apr. 2016, pages 2119-2126, Pisa, Italy

  64. POPL
    [pdf] Damien Octeau, Somesh Jha, Matthew Dering, Patrick McDaniel, Alexandre Bartel, Li Li, Jacques Klein, and Yves Le Traon, Combining Static Analysis with Probabilistic Models to Enable Market-Scale Android Inter-component Analysis, Symposium on Principles of Programming Languages (POPL), Jan. 2016, pages 469-484, St Petersburg, Florida, USA, acceptance rate: 23.32% (59/253)

  65. SAC
    [pdf] Li Li, Daoyuan Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Towards a Generic Framework for Automating Extensive Analysis of Android Applications, The 31st ACM/SIGAPP Symposium on Applied Computing (SAC), ACM, Apr. 2016, pages 1460-1465, Pisa, Italy

  66. EMSE
    [pdf] Kevin Allix, Tegawendé F. Bissyandé, Quentin Jérome, Jacques Klein, Radu State, and Yves Le Traon, Empirical Assessment of Machine Learning-Based Malware Detectors for Android: Measuring the Gap between In-the-Lab and In-the-Wild Validation Scenarios, Empirical Software Engineering (journal first), Springer, Feb. 2016, Volume 21, Issue 1 (First online: November 2014), pages 183–211

  67. 2015

  68. IST
    [pdf] Phu H. Nguyen, Max Kramer, Jacques Klein, Yves Le Traon, An Extensive Systematic Review on the Model-Driven Development of Secure Systems, Information and Software Technology (IST), Elsevier, Dec. 2015 , Volume 68 Issue C, pages 62-81

  69. ASE
    [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Automating the Extraction of Model-based Software Product Lines from Model Variants, 30th IEEE/ACM International Conference on Automated Software Engineering (ASE), IEEE, Nov. 2015, pages 396-406, Lincoln, Nebraska, USA, acceptance rate: 20.76%, (60/289)

  70. QRS
    [pdf] Li Li, Kevin Allix, Daoyuan Li, Alexandre Bartel, Tegawendé F. Bissyandé, and Jacques Klein, Potential Component Leaks in Android Apps: An Investigation into a New Feature Set for Malware Detection, IEEE International Conference on Software Quality, Reliability and Security (QRS), IEEE, Aug. 2015, pages 195-200, Vancouver, Canada

  71. GECCO
    [pdf] Jabier Martinez, Gabriele Rossi, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Estimating and Predicting Average Likability on Computer-Generated Artwork Variants (2 pages paper), Proceedings of the Companion Publication of the 2015 on Genetic and Evolutionary Computation Conference (GECCO), ACM, Jul. 2015, pages 1431-1432, Madrid, Spain

  72. SmartGridComm
    [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Yves Reckinger, Tejeddine Mouelhi, Jacques Klein, Yves Le Traon, Suspicious Electric Consumption Detection Based on Multi-Profiling Using Live Machine Learning, 6th IEEE International Conference on Smart Grid Communications (SmartGridComm), IEEE, Nov. 2015, pages 891-896, Miami, USA

  73. MODELS
    [pdf] Phu H. Nguyen, Koen Yskout, Thomas Heyman, Jacques Klein, Riccardo Scandariato and Yves Le Traon, Model-Driven Security based on A Unified System of Security Design Patterns, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 246-255, Ottawa, Canada, acceptance rate: 26%, 35/132

  74. MODELS
    [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Gregory Nain, Jacques Klein and Yves Le Traon, Beyond Discrete Modeling: A Continuous and Efficient Model for IoT, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 90-99, Ottawa, Canada, acceptance rate: 26%, 35/132

  75. MODELS
    [pdf] Thomas Hartmann, Assaad Moawad, François Fouquet, Gregory Nain, Jacques Klein and Yves Le Traon, Stream my Models: Reactive Peer-to-Peer Distributed Models@run.time, ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems (MODELS), Sept. 2015, pages 80-89, Ottawa, Canada, acceptance rate: 26%, 35/132

  76. SPLC
    [pdf] Jabier Martinez, Tewfik Ziadi, Tegawendé F. Bissyandé, Jacques Klein, and Yves Le Traon, Bottom-Up Adoption of Software Product Lines - A Generic and Extensible Approach, International Software Product Line Conference (SPLC), ACM, Jul. 2015, pages 101-110, Nashville, US

  77. IFIPSec
    [pdf] Li Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, ApkCombiner: Combining Multiple Android Apps to Support Inter-App Analysis, 30th International Information Security and Privacy Conference (IFIPSec), May 2015, pages 513-527, Hamburg, Germany, acceptance rate: 19.8%, 42/212

  78. ICSE
    [pdf] Li Li, Alexandre Bartel, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Steven Arzt, Siegfried Rasthofer, Eric Bodden, Damien Octeau and Patrick McDaniel, IccTA: Detecting Inter-Component Privacy Leaks in Android Apps, The 37th International Conference on Software Engineering (ICSE), IEEE/ACM, May 2015, pages 280-291, Firenze, Italy, acceptance rate: 18.5%, 84/452

  79. Modelsward
    [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Johann Bourcier, and Jacques Klein, Polymer: Simplifying Complex Multi-Objective Optimizations Using A Model-Driven Approach, MODELSWARD - International Conference on Model-Driven Engineering and Software Development, Feb. 2015, Angers, France

  80. SAC
    [pdf] Assaad Moawad, Thomas Hartmann, François Fouquet, Jacques Klein and Yves Le Traon,, Adaptive Blurring of Sensor Data for balancing Privacy and Utility for Ubiquitous Services, The 30th ACM/SIGAPP Symposium On Applied Computing (SAC), Software Platforms Track, Apr. 2015, Salamanca, Spain

  81. ESSOS
    [pdf] Kevin Allix, Tegawendé F. Bissyandé, Jacques Klein and Yves Le Traon, Are Your Training Datasets Yet Relevant? - An Investigation into the Importance of Timeline in Machine Learning-Based Malware Detection, International Symposium on Engineering Secure Software and Systems (ESSOS), Springer, LNCS 8978, Mar. 2015, Milan, Italy, acceptance rate: 27%, 11/41

  82. 2014

  83. TSE
    [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon, Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 7, Jul. 2014, pages 650 - 670

  84. TSE
    [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Static Analysis for Extracting Permission Checks of a Large Scale Framework: The Challenges And Solutions for Analyzing Android, IEEE Transactions on Software Engineering (journal first), IEEE, Volume 40, Issue 6, Jun. 2014, pages 617-632

  85. PLDI
    [pdf] Steven Arzt, Siegfried Rasthofer, Christian Fritz, Eric Bodden, Alexandre Bartel, Jacques Klein, Yves Le Traon, Damien Octeau, and Patrick McDaniel, FlowDroid: Precise Context, Flow, Field, Object-sensitive and Lifecycle-aware Taint Analysis for Android Apps, ACM SIGPLAN conference on Programming Language Design and Implementation (PLDI), Jun. 2014, pages 259-269, Edinburgh, UK, acceptance rate: 18%, 52/287

  86. SEKE
    [pdf] Thomas Hartmann, François Fouquet, Brice Morin, Gregory Nain, Jacques Klein and Yves Le Traon, Reasoning at Runtime using time-distorted Contexts: A Models@run.time based Approach, International Conference on Software Engineering & Knowledge Engineering (SEKE), (best paper awards), Jul. 2014, pages 586-591, Vancouver, Canada

  87. TrustCom
    [pdf] Li Li, Alexandre Bartel, Jacques Klein, Yves Le Traon, Automatically Exploiting Potential Component Leaks in Android Applications, The 13th IEEE International Conference on Trust, Security and Privacy in Computing and Communications (IEEE TrustCom-14), IEEE, Sept. 2014, pages 388-397, Beijing, China, acceptance rate: 31.7%, 73/230

  88. SmartGridComm
    [pdf] Thomas Hartmann, François Fouquet, Jacques Klein, Yves Le Traon, Alexander Pelov, Laurent Toutain, Tanguy Ropitault, Generating Realistic Smart Grid Communication Topologies Based on Real-Data, 5th IEEE International Conference on Smart Grid Communications (SmartGridComm 2014), IEEE, Nov. 2014, pages 428-433, Venice, Italy

  89. MODELS
    [pdf] Thomas Hartmann, François Fouquet, Gregory Nain, Brice Morin, Jacques Klein, Olivier Barais, Yves Le Traon, A Native Versioning Concept to Support Historized Models at Runtime, ACM/IEEE 17th International Conference on Model Driven Engineering Languages and Systems (MODELS 2014), Springer, LNCS 8767, Oct. 2014, pages 252-268, Valencia, Spain, acceptance rate: 24%, 30/126

  90. VISSOFT
    [pdf] Jabier Martinez, Tewfik Ziadi, Raul Mazo, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon, Feature Relations Graphs: A Visualisation Paradigm for Feature Constraints in Software Product Lines, IEEE Working Conference on Software Visualization (VISSOFT), Oct. 2014, pages 50-59, Victoria, BC, Canada

  91. COMPSAC
    [pdf] Kevin Allix, Quentin Jerome, Tegawendé F. Bissyandé, Jacques Klein, Radu State and Yves Le Traon, A forensic analysis of Android Malware - How is Malware Written and How it Could be Detected?, IEEE Computer Software and Applications Conference (COMPSAC 2014), Jul. 2014, Vasteras, Sweden, acceptance rate: 22%, ?/?

  92. BookChapter
    [pdf] Levi Lucio, Qin Zhang, Phu H. Nguyen, Moussa Amrani, Jacques Klein, Hans Vangheluwe, Yves Le Traon, Advances in Model-Driven Security, Advances in Computers, in Atif Memon (Ed.), Volume 93, 2014, pages 103-152

  93. TAOSD
    [pdf] Phu H. Nguyen, Gregory Nain, Jacques Klein, Tejeddine Mouelhi, Yves Le Traon, Modularity and Dynamic Adaptation of Flexibly Secure Systems: Model-Driven Adaptive Delegation in Access Control Management, Transactions on Aspect-Oriented Software Development (TAOSD), Springer, LNCS 8400, 2014, pages 109-144

  94. ECMFA
    [pdf] Jabier Martinez, Tewfik Ziadi, Jacques Klein, Yves Le Traon, Identifying and Visualising Commonality and Variability in Model Variants, European Conference on Modelling Foundations and Applications (ECMFA), Springer, LNCS 8569, Jul. 2014, pages 117-131, York, United Kingdom, acceptance rate: 28%, 14/49

  95. CODASPY
    [pdf] Kevin Allix, Tegawendé F. Bissyandé, Quentin Jérome, Jacques Klein, Radu State, Yves Le Traon, Large-scale machine learning-based malware detection: confronting the 10-fold cross validation scheme with reality, ACM Conference on Data and Application Security and Privacy (CODASPY), (short paper/poster), Mar. 2014, pages 163-166, San Antonio, TX, USA


  96. [pdf] Thomas Hartmann, François Fouquet, Jacques Klein, Gregory Nain, Yves Le Traon, Reactive Security for Smart Grids using Models@run.time-Based Simulation and Reasoning, Second Open EIT ICT Labs Workshop on Smart Grid Security, Feb. 2014, Munich, Germany


  97. [pdf] Phu H. Nguyen, Jacques Klein, Yves Le Traon, Model-Driven Security with A System of Aspect-Oriented Security Design Patterns, 2nd Workshop on View-Based, Aspect-Oriented and Orthographic Software Modelling, Jul. 2014, York, United Kingdom

  98. 2013

  99. APSEC
    [pdf] Phu H. Nguyen, Jacques Klein, Max Kramer, Yves Le Traon, A Systematic Review of Model-Driven Security, 20th Asia-Pacific Software Engineering Conference Proceedings (APSEC), IEEE, Dec. 2013, pages 432-441, Bangkok, Thailand

  100. ISSRE
    [pdf] Tegawendé F. Bissyandé, David Lo, Lingxiao Jiang, Laurent Reveillere, Jacques Klein, Yves Le Traon, Got Issues? Who Cares About It? A Large Scale Investigation of Issue Trackers from GitHub, 24th International Symposium on Software Reliability Engineering (ISSRE), IEEE, Nov. 2013, pages 188-197, Pasadena, CA, USA, acceptance rate: 35%, 46/131

  101. Usenix Security
    [pdf] Damien Octeau, Patrick McDaniel, Somesh Jha, Alexandre Bartel, Eric Bodden, Jacques Klein, Yves Le Traon, Effective Inter-Component Communication Mapping in Android with Epicc: An Essential Step Towards Holistic Security Analysis, Usenix Security, USENIX Association, Aug. 2013, pages 543-558, Washington D.C., USA, acceptance rate: 16%, 44/277

  102. SPLC
    [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Multi-objective Test Generation for Software Product Lines, 17th International Software Product Line Conference (SPLC), ACM, Aug. 2013, pages 62-71, Tokyo, Japan, acceptance rate: 33%, 18/55

  103. ICMT
    [pdf] Max E. Kramer, Jacques Klein, Jim R. H. Steel, Brice Morin, Jörg Kienzle, Olivier Barais, and Jean-Marc Jézéquel, Achieving Practical Genericity in Model Weaving through Extensibility, International Conference on Model Transformation (ICMT), Springer, LNCS 7909, Jun. 2013, pages 108-124, Budapest, Hungary, acceptance rate: 21%, 12/58

  104. NIER@ICSE
    [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Towards Automated Testing and Fixing of Re-engineered Feature Models, International Conference of Software Engineering, New Ideas & Emerging Results Track (NIER@ICSE), IEEE Press, May 2013, pages 1245-1248, San Francisco, USA, acceptance rate: 22%, 31/143

  105. AOSD
    [pdf] Phu H. Nguyen, Gregory Nain, Jacques Klein, Tejeddine Mouelhi and Yves Le Traon, Model-Driven Adaptive Delegation, 12th International Conference on Aspect Oriented Software Development - AOSD 2013, ACM, Mar. 2013, pages 61-72, Fukuoka, Japan, acceptance rate: 27%, 17/62

  106. AFRICOMM
    [pdf] Tegawendé F. Bissyandé, Daouda Ahmat, Jonathan Ouoba, Gertjan van Stam, Jacques Klein, Yves Le Traon, Sustainable ICT4D in Africa: Where Do We Go from Here?, EAI International Conference on e‐Infrastructure and e‐Services for Developing Countries, AFRICOMM 2013, 2013, pages 95-103, Blantyre, Malawi

  107. AFRICOMM
    [pdf] Miguel A. Olivares-Méndez, Tegawendé F. Bissyandé, Kannan Somasundar, Jacques Klein, Holger Voos, Yves Le Traon, The NOAH Project: Giving a Chance to Threatened Species in Africa with UAVs, EAI International Conference on e‐Infrastructure and e‐Services for Developing Countries, AFRICOMM 2013, 2013, pages 198-208, Blantyre, Malawi

  108. AMOST@ICST
    [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, Assessing Software Product Line Testing via Model-based Mutation: An Application to Similarity Testing, th Workshop on Advances in Model Based Testing (A-MOST 2013), Co-located with the 6th IEEE International Conference on Software Testing, Verification and Validation (ICST 2013), Mar. 2013, Luxembourg, Luxembourg

  109. Tool@SPLC
    [pdf] Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon, PLEDGE: A Product Line Editor and Test Generation Tool, Demonstrations and Tools, 17th International Software Product Line Conference (SPLC 2013), Aug. 2013, pages 126-129, Tokyo, Japan

  110. TechReport
    [pdf] Christian Fritz, Steven Arzt, Siegfried Rasthofer, Eric Bodden, Alexandre Bartel, Jacques Klein, Yves Le Traon, Damien Octeau, Patrick McDaniel, Highly Precise Taint Analysis for Android Applications, EC SPRIDE Technical Report TUD-CS-2013-0113, 2013

  111. 2012

  112. ASE
    [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Automatically Securing Permission-Based Software by Reducing the Attack Surface: An Application to Android, IEEE/ACM International Conference on Automated Software Engineering, ASE 2012, ACM, Sept. 2012, pages 274-277, Essen, Germany, acceptance rate: 33%, 45/138, 21 long+ 24 short

  113. SQJ
    [pdf] Gilles Perrouin, Sebastian Oster, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon, Pairwise testing for software product lines: Comparison of two approaches, Software Quality Journal (SQJ), Springer, Volume 20, Sept. 2012, pages 605-643

  114. TechReport
    [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Kevin Allix, Yves Le Traon, Improving Privacy on Android Smartphones Through In-Vivo Bytecode Instrumentation, Technical Report, ISBN: 978-2-87971-111-9, University of Luxembourg, May 2012

  115. ERCIM
    [pdf] Tom Mens, Jacques Klein, Evolving Software - Introduction to the Special Theme, ERCIM News, 2012

  116. SOAP
    [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Dexpler: Converting Android Dalvik Bytecode to Jimple for Static Analysis with Soot, ACM Sigplan International Workshop on the State Of The Art in Java Program Analysis (SOAP), Jun. 2012, Beijing, China

  117. NIER@ICSE
    [pdf] Gilles Perrouin, Brice Morin, Franck Chauvel, Franck Fleurey, Jacques Klein, Yves Le Traon, Olivier Barais, Jean-Marc Jézéquel, Towards Flexible Evolution of Dynamically Adaptive Systems, International Conference of Software Engineering, New Ideas & Emerging Results Track (NIER@ICSE), Jun. 2012, pages 1353-1356, Zurich, Switzerland, acceptance rate: 18%, 26/147

  118. DSAL@AOSD
    [pdf] Max Kramer, Jacques Klein, Jim R. H. Steel, Building Specifications as a Domain-Specific Aspect Language, Seventh Workshop on Domain-Specific Aspect Languages, DSAL’12@AOSD, Mar. 2012, Postdam, Germany

  119. 2011

  120. Vary@Models
    [pdf] Paul Istoan, Jacques Klein, Gilles Perrouin, Jean-Marc Jézéquel, A Metamodel-based Classification of Variability Modeling Approaches, VARY International Workshop @MODELS2011, Oct. 2011, New Zeeland

  121. TechReport
    [pdf] Alexandre Bartel, Jacques Klein, Martin Monperrus, Yves Le Traon, Automatically Securing Permission-Based Software by Reducing the Attack Surface: An Application to Android, Technical Report, University of Luxembourg, Oct. 2011

  122. ECMFA
    [pdf] Mauricio Alferez, Nuno Amalio, Selim Ciraci, Franck Fleurey, Jörg Kienzle, Jacques Klein, Max Kramer, Sebastien Mosser, Gunter Mussbacher, Ella Roubtsova and Gefei Zhang, Aspect-Oriented Model Development at Different Levels of Abstraction, Seventh European Conference on Modelling Foundations and Applications (ECMFA 2011), Jun. 2011, pages 361-376, Birmingham, UK, acceptance rate: 36%, 19/53

  123. MUTATION
    [pdf] Alexandre Bartel, Benoit Baudry, Freddy Munoz, Jacques Klein, Tejeddine Mouelhi and Yves Le Traon, Model Driven Mutation Applied to Adaptative Systems Testing, Mutation 2011 (@ICST), Mar. 2011, pages 408-413, Berlin, Germany, acceptance rate: 50%, 10/20

  124. VAMOS
    [pdf] Paul Istoan, Nicolas Biri, Jacques Klein, Issues in Model-Driven Behavioural Product Derivation, Fifth International Workshop on Variability Modelling of Software-intensive Systems (Vamos 2011), ACM, 2011, pages 69-78, Namur, Belgium, acceptance rate: 55%, 21/38

  125. 2010

  126. TAOSD
    [pdf] Jörg Kienzle, Wisam Al Abed, Franck Fleurey, Jean-Marc Jézéquel and Jacques Klein, Aspect-Oriented Design with Reusable Aspect Models, Transactions on Aspect-Oriented Software Development (TAOSD) - journal first, Springer, LNCS 6210, 2010, pages 272-320

  127. ICST
    [pdf] Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry and Yves Le Traon, Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines, Third International Conference on Software Testing, Verification and Validation (ICST 2010), IEEE Computer Society, Apr. 2010, pages 459-468, Paris, France, acceptance rate: 26%, 41/154

  128. MODELS
    [pdf] Brice Morin, Jacques Klein, Jörg Kienzle and Jean-Marc Jézéquel, Flexible Model Element Introduction Policies for Aspect-Oriented Modeling, 13th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS 2010), Springer LNCS 6395, Oct. 2010, pages 63-77, Oslo, Norway, acceptance rate: 21%, 43/207

  129. 2009

  130. MODELS
    [pdf] Jacques Klein, Jörg Kienzle, Brice Morin, Jean-Marc Jézéquel, Aspect Model Unweaving, 12th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems (MODELS 2009), Springer, LNCS 5795, Oct. 2009, pages 514-530, Denver, Colorado, USA, acceptance rate: 16%, 34/211

  131. AOSD
    [pdf] Jörg Kienzle, Wisam Al Abed, Jacques Klein, Aspect-Oriented Multi-View Modeling, 8th International Conference on Aspect Oriented Software Development (AOSD.09), ACM, Mar. 2009, pages 87-98, Charlotteville, Virginia, USA, acceptance rate: 22%, 19/86

  132. 2008

  133. SPLC
    [pdf] Gilles Perrouin, Jacques Klein, Nicolas Guelfi, Jean-Marc Jézéquel, Reconciling Automation and Flexibility in Product Derivation, 12th International Software Product Line Conference (SPLC 2008), IEEE, Sept. 2008, pages 339-348, Limerick, Ireland, acceptance rate: 30%, 33/110

  134. ICCBSS
    [pdf] Olivier Barais, Jacques Klein, Benoit Baudry, Andrew Jackson, Siobhan Clarke, Composing Multi-View Aspect Models, 7th IEEE International Conference on Composition Based Software Systems (ICCBSS), Feb. 2008, Madrid, Spain

  135. EA@ICSE
    [pdf] Brice Morin, Jacques Klein, Olivier Barais, Jean-Marc Jézéquel, A Generic Weaver for supporting Product Lines, Early Aspects Workshop at ICSE, ACM, May 2008, pages 11-18, Leipzig, Germany

  136. 2007

  137. TAOSD
    [pdf] Jacques Klein, Franck Fleurey and Jean-Marc Jézéquel, Weaving Multiple Aspects in Sequence Diagrams, Transactions on Aspect-Oriented Software Development (TAOSD) - journal first, 2007, pages 167-199

  138. AOM@Models
    [pdf] Jacques Klein and Jörg Kienzle, Reusable Aspect Models, 11th Workshop on Aspect Oriented Modeling, AOM at Models’07, Sept. 2007, Nashville, USA

  139. IDM
    [pdf] Jacques Klein, Benoit Baudry, Olivier Barais, Andrew Jackson, Introduction du test dans la modélisation par aspects, 3ème journées sur l'Ingénierie Dirigée par les Modèles (IDM'07), Mar. 2007, Toulouse, France

  140. 2006

  141. PhD thesis
    [pdf] Jacques Klein, Aspects Comportememtaux et Tissage, PhD Thesis, University of Rennes 1, Dec. 2006, Rennes, France

  142. LMO
    [pdf] Jacques Klein and Franck Fleurey, Tissage d'Aspects Comportementaux, Langages et Modèles à Objets (LMO'06), Mar. 2006, Nimes, France, acceptance rate: 38%, 13/34


  143. [pdf] Andrew Jackson, Jacques Klein, Benoit Baudry and Siobhan Clarke, KerTheme: Testing Aspect Oriented Models, Workshop on Integration of Model Driven Development and Model Driven Testing at EC-MDA, Jul. 2006, Bilbao, Spain

  144. MDSD@Ecoop
    [pdf] Andrew Jackson, Jacques Klein, Benoit Baudry and Siobhan Clarke, Testing Executable Themes, Workshop on Models and Aspects - Handling Crosscutting Concerns in MDSD at ECOOP 2006, Jul. 2006, Nantes, France

  145. AOSD
    [pdf] Jacques Klein, Loic Hélouët and Jean-Marc Jézéquel, Semantic-based Weaving of Scenarios, 5th International Conference on Aspect Oriented Software Development (AOSD.06), ACM, Mar. 2006, pages 87-98, Bonn, Germany, acceptance rate: 21%, 20/95

  146. 2005

  147. EA@SPLC
    [pdf] Jacques Klein and Jean-Marc Jézéquel, Problems of the Semantic-based Weaving of Scenarios, Aspects and Software Product Lines: An Early Aspects Workshop at SPLC Europe 2005, Sep. 2005, Rennes, France

  148. MDSD@Ecoop
    [pdf] Jacques Klein, Jean-Marc Jézéquel and Noel Plouzeau, Weaving Behavioural Models, First Workshop on Models and Aspects - Handling Crosscutting Concerns in MDSD at Eccop 05, Jul. 2005, Glasgow, United Kingdom

  149. 2004

  150. FMICS
    [pdf] Jacques Klein, Benoit Caillaud, and Loic Hélouët, Merging scenarios, Formal Methods for Industrial Critical Systems (FMICS), vol. 133, ENTCS, Sept. 2004, pages 209--226, Linz, Austria, acceptance rate: 58%, 17/29

  151. MDAFA
    [pdf] Jacques Klein and Noel Plouzeau, Transformation of behavioral models based on compositions of sequence diagrams, Model Driven Architecture: Foundations and Applications 2004 (MDAFA), Jun. 2004, page 255, Linkoping, Sweden